Agilent / Keysight N5245B PNA-X Microwave Network Analyzer, 10 MHz to 50 GHz

The Keysight N5245B PNA-X is a microwave network analyzer spanning 10 MHz to 50 GHz, delivering integrated multi-port characterization for active and passive devices. This dual- or quad-port instrument consolidates S-parameter measurement, noise analysis, and nonlinear device testing into a single platform, eliminating the need for separate test engines. With dynamic range exceeding 140 dB, output power to +16 dBm, and measurement accuracy below 0.001 dB on S-parameters, the N5245B addresses demanding RF and microwave development workflows.

– Technical Specifications

• Frequency range: 10 MHz to 50 GHz (configurable to 900 Hz lower limit)
• Port configurations: 2-port or 4-port
• Built-in signal sources: 1 or 2, expandable to 3 (third source to 13.5 GHz)
• System dynamic range: 126–135 dB; receiver dynamic range: 129 dB; peak capability: >140 dB
• S-parameter accuracy: <0.001 dB
• Group delay accuracy: <0.3 ps
• IMD: <−120 dBc
• Output power: +16 dBm maximum; 10–13 dBm at 20 GHz
• Power sweep range: 38–41 dB
• IF bandwidth: 15 MHz (standard); 1 kHz (trace noise); 10 Hz (noise floor)
• Noise floor: −111 dBm at 10 Hz IF bandwidth
• Trace noise: 0.002 dB rms (1 kHz BW)
• Harmonics: −51 to −60 dBc typical
• Measurement points: 32,001 maximum
• Measurement channels: 200; unlimited traces
• Data transfer: up to 3.2 Gbps
• Dimensions (H × W × D): 280 × 459 × 649 mm
• Weight (2-port): 46 kg

– Key Features

• Sweep modes: linear, log, power, CW, phase, and segment
• S-parameter and noise receivers with optional noise capability to 50 GHz
• Pulse modulators and generators for transient characterization
• Bias tees, source and receiver attenuators, mechanical switches
• Advanced calibration with multiport error correction
• Multi-touch display with equation editor and time-domain analysis
• PathWave Calibration Advisor for interval tracking

– Typical Applications

• Active device characterization: amplifiers, mixers, frequency converters
• S-parameter and noise measurement across microwave bands
• Power-dependent nonlinear device testing
• Multiport component and subsystem validation

– Compatibility & Integration

Compatible with Keysight PLTS software and PathWave measurement solutions for automated test workflows.