Agilent/Keysight N7778C

The Agilent/Keysight N7778C is a Value Line tunable external cavity laser (ECL) source engineered for optical testing and component development in telecommunications and fiber optics. It delivers precise wavelength control, excellent spectral purity, and stable output power across five selectable wavelength bands. The instrument combines high-performance signal generation with cost-effectiveness, making it suitable for high-throughput manufacturing and R&D environments requiring superior signal quality and low spontaneous emission.

– Technical Specifications

Wavelength Options
• 1240–1380 nm
• 1250–1370 nm
• 1340–1495 nm
• 1450–1650 nm
• 1490–1640 nm

Output Power
Standard configurations deliver ≥ +12 dBm peak power (options 114, 116, 216) or ≥ +13 dBm (option 113). Extra-high power option (013) provides > +18 dBm peak. Within optimized ranges (1515–1620 nm, 1410–1470 nm, 1290–1340 nm), output sustains ≥ +11 dBm. Across full tuning range, minimum output is ≥ +5 dBm to ≥ +8 dBm depending on wavelength.

Spectral Performance
Signal-to-spontaneous-emission ratio reaches ≥ 75 dB/nm (typical standard units) and ≥ 50 dB/nm for option 013. Spectral linewidth measures < 10 kHz. Absolute wavelength accuracy is ±4 pm to ±5 pm under static conditions and ±10 pm (typical) during sweep operation. Wavelength repeatability is ±1.5 pm at two-way sweeps.

Tuning & Stability
Continuous wavelength sweep capability reaches 200 nm/s in bidirectional mode. Long-term stability is maintained across extended operation.

– Key Features

• Five wavelength band options covering 1240–1650 nm
• Spectral linewidth < 10 kHz for narrow-line signal generation
• Tuning speeds to 200 nm/s enable rapid wavelength scanning
• Sub-picometer wavelength repeatability (±1.5 pm) for precision measurements
• Web browser or USB remote control with optional local touch-screen interface
• Compact single rack unit form factor

– Typical Applications

• Fiber optic component characterization and wavelength-dependent loss measurements
• Insertion loss and dispersion testing across C and L bands
• Silicon photonics and integrated photonics device validation
• Polarization-dependent loss assessments

– Compatibility & Integration

Software compatibility with Keysight 8160xA and 81600B platforms enables integration into existing test environments. The N7778C operates with Keysight's Photonics Application Suite for spectral analysis. System expansion is possible through pairing with N774xC multiport power meters and N7786C polarization synthesizers.