Agilent/Keysight PD1550A

The Keysight PD1550A is an Advanced Dynamic Power Device Analyzer and Double-Pulse Tester engineered for dynamic characterization of wide-bandgap (SiC, GaN) power semiconductor discrete devices and modules. It delivers repeatable measurement of turn-on, turn-off, switching, dynamic on-resistance, gate charge, reverse recovery, and dynamic voltage/current parameters up to 1500 V and 3000 A. The system combines isolated probe technology, solderless contact methods, and advanced measurement techniques—including probe compensation, offset adjustment, de-skewing, and common-mode noise rejection—to simplify complex power semiconductor testing. Built-in AutoCal semi-automated calibration and parasitic de-embedding address system gain, offset, and inductive errors. Safety features include an interlock-equipped enclosure and modular architecture for expandability.

– Technical Specifications

• Maximum output voltage: 1500 V
• Maximum output current: 3000 A
• Minimum current measurement resolution: 10 fA
• Supported measurements: Turn-on characteristics, turn-off characteristics, switching characteristics, dynamic on-resistance, gate charge, reverse recovery, dynamic voltage/current
• Installation category: INSTALLATION CATEGORY II (mains input), INSTALLATION CATEGORY I (measurement input)
• Pollution degree: POLLUTION DEGREE 2 per IEC 61010-1

– Key Features

• True Pulse isolated probe technology for high-side device measurement under large voltage swings and fast slew rates
• Solderless contact technology enabling repeatable, reliable results without soldering
• Semi-automated calibration (AutoCal) correcting system gain and offset errors
• De-embedding techniques compensating for inductive parasitics in current shunts
• Safety enclosure with interlock protection for user and hardware
• Short-Circuit (Type 1) testing support with appropriate accessories

– Typical Applications

• Dynamic characterization of 650 V, 1.2 kV, 1.7 kV, and 2 kV-rated discrete power semiconductors
• Wide-bandgap device and module testing for SiC and GaN technologies
• Power module evaluation across 2-in-1, 4-in-1, and 6-in-1 configurations

– Compatibility & Integration

Modular platform design enables expandability and customization for diverse characterization requirements. Operates with all rack panels in place and safety enclosure closed.