The Agilent N9320B is a 9 kHz to 3 GHz RF spectrum analyzer engineered for electronics manufacturing, R&D, bench repair, and RF education. It delivers essential spectrum analysis with minimum resolution bandwidth of 10 Hz for distinguishing closely spaced signals and displayed average noise level as low as −148 dBm (preamplifier engaged), enabling detection of low-level signals across the entire frequency range.
– Technical Specifications
Frequency Range: 9 kHz to 3 GHz
Resolution & Sensitivity:
• Resolution Bandwidth: 10 Hz to 1 MHz (1-3-10 steps)
• Displayed Average Noise Level: −130 dBm (preamplifier off); −148 dBm (preamplifier on)
• Sweep Time (minimum non-zero span): < 10 ms
Amplitude Performance:
• Overall Amplitude Accuracy: ±0.5 dB
• Frequency Response: ±0.8 dB
Phase Noise:
• 10 kHz offset: < 88 dBc/Hz
• 100 kHz offset: < 100 dBc/Hz
• 1 MHz offset: < 110 dBc/Hz
Input Characteristics:
• RF Input Connector: Type N female, 50 Ω
• VSWR: −20 dBm typical
Linearity Metrics:
• Third Order Intercept (TOI): +13 dBm
• 1 dB Compression Point: +0 dBm
– Key Features
Power Measurements: Built-in analysis includes channel power, occupied bandwidth (OBW), adjacent channel power (ACP), spectrum emission mask (SEM), and third order intercept. Supports Agilent/Keysight U2000 series USB power sensors for extended RF and microwave power measurement capabilities.
Modulation Analysis Options: Optional AM/FM demodulation module (N9320B-AMA) provides carrier power, modulation rate, AM depth, frequency deviation, SINAD, and carrier frequency offset metrics. Optional ASK/FSK demodulation module (N9320B-DMA) delivers carrier power, error metrics, depth/deviation measurements, and four display modes: symbol, waveform, error, and eye diagram.
EMI Pre-compliance: Optional CISPR EMI filters (−6 dB) available at 200 Hz, 9 kHz, 120 kHz, and 1 MHz resolution bandwidths support pre-compliance testing with positive peak detector integration.
Stimulus-Response Measurements: Optional tracking generator (N9320B-TG3) extends capability to 3 GHz for component characterization and network analysis.
– Typical Applications
Electronics manufacturing, R&D projects, bench repair, RF education, EMI pre-compliance testing, and component characterization.
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