ANRITSU MP1590B Performance Tester with MU150100A AND OPTION 03

The Anritsu MP1590B Performance Tester with MU150100A and Option 03 is a modular signal generation and analysis platform for evaluating digital communications across optical and electrical interfaces from 1.5 Mbps to 10.7 Gbps. The system performs protocol-layer testing, jitter measurement, and multichannel analysis suitable for network equipment validation, telecommunications testing, and R&D environments.

– Technical Specifications

MP1590B Mainframe
• 6-slot modular architecture
• Operating system: Windows XP
• Integrated display
• Dimensions: 320 (W) × 177 (H) × 350 (D) mm
• Weight: 13 kg maximum (excluding options and units)
• Remote control: Ethernet, RS-232C, GPIB

MU150100A Multirate Unit
• Interface support: 1.5 Mbps to 10.7 Gbps, including 10/10.7G and 10.3G (10 GbE)
• Optical wavelength: 1260 to 1610 nm
• Clock output: 1.3 to 0.6 Vp-p
• Data output: 0 to –0.2 V (High), –0.85 to –1.5 V (Low)
• Data input: 1.5 to 0.3 Vp-p
• Side-mode suppression ratio: ≥30 dB
• Optical overload rating: +3 dBm average
• Frequency accuracy: ±0.1 ppm
• Offset range: ±100 ppm / 0.1 ppm step
• Electrical reference clocks: 1.544 MHz, 2.048 MHz, 5 MHz, 10 MHz, 64 kHz + 8 kHz
• Electrical data rates: D1–D3 at 192 kbit/s, D4–D12 at 576 kbit/s, GCC0–2 at 13124 kbit/s and 326.7 kbit/s

Option 03 — High-Accuracy Jitter Measurement
• Jitter measurement accuracy: ±20 mUIp-p (ITU-T O.172 Appendix VIII calibrated)
• Jitter measurement repeatability: ±5 mUIp-p
• Supported rates: SDH/SONET 52 Mbit/s to 10.7 Gbit/s, OTU-1 (2.66 Gbit/s), OTU-2 (10.71 Gbit/s), 10.3 Gbit/s 10G Ethernet
• Jitter tolerance and transfer measurement per ITU-T Rec. G.783, G.825

– Key Features

• Multichannel simultaneous measurement capability
• Dual optical and electrical interface support
• High-precision jitter generation and tolerance testing
• Modular expansion via six-slot architecture
• Sub-microsecond timing accuracy at ±0.1 ppm

– Typical Applications

• SDH/SONET equipment performance validation
• OTU and 10G Ethernet interface testing
• Jitter tolerance compliance measurement
• Protocol-layer network diagnostics
• Telecommunications and data network R&D

– Compatibility & Integration

Integrates optical signals (1260–1610 nm) and electrical reference clocks (1.544–10 MHz) for layered network testing. Remote operation via Ethernet, RS-232C, and GPIB interfaces.