The Anritsu MS46131A is a modular, PC-controlled 1-port vector network analyzer engineered for high-accuracy return loss and reflection measurements. Built on Anritsu’s patented VNA-on-chip technology using nonlinear transmission line (NLTL) principles, it delivers a simplified architecture with reduced cost and enhanced measurement repeatability. The compact, lightweight design permits direct VNA port placement at the device under test, minimizing cable length effects and improving measurement stability. Extended-K™ ports guarantee performance to 43.5 GHz. The instrument supports simultaneous operation of up to four independent MS46131A units across separate software instances, each with configurable frequency ranges and calibration. PhaseLync™ technology enables phase synchronization between two MS46131A units for vector 2-port S-parameter measurements over distances up to 100 meters.
## Technical Specifications
• Frequency Range Options: 1 MHz to 8 GHz; 1 MHz to 20 GHz; 1 MHz to 43.5 GHz
• S-parameter and time domain measurements
• Dynamic Range: 91 dB (97 dB typical) for -020 and -043 options; 90 dB (105 dB typical) in 5–7 GHz band for Options 25, 50, or 100; 89 dB (105 dB typical) for Option 12 satellite SDR in 5–7 GHz
• Data Points: 2 to 16,001 configurable
• Display: Up to 16 channels with maximum 16 traces each
• Warm-up Time: 60 minutes (ON state)
• Operating Temperature: 25 °C ± 5 °C
• Test Port: Extended-K™
• Control Interface: USB
## Key Features
• Modular 1-port architecture with no on-board memory—ideal for secure environments requiring no data purging
• Fast sweep speed with excellent corrected directivity
• Simultaneous multi-unit operation for parallel testing workflows
• PhaseLync™ synchronization option for 2-port vector measurements up to 100 meters separation
• Time Domain with Time Gating available (Option MS46131A-002)
• Runs unified GUI software across all instances
## Typical Applications
• Passive 5G mmWave component characterization
• RF and microwave engineering test and validation
• Manufacturing return loss and reflection testing
• Educational laboratory environments
• Field applications and space-constrained test setups
## Compatibility & Integration
PC-controlled via USB with external processing. Supports simultaneous operation across separate software instances and phase-coherent multi-instrument configurations.
