Anritsu MS9700A – Optical Spectrum Analyzer

The Anritsu MS9700A is an Optical Spectrum Analyzer engineered for optical spectrum analysis across R&D, manufacturing, and maintenance applications. It delivers precise wavelength measurement and dynamic range performance critical for optical communication systems, WDM systems, and optical device characterization. The instrument combines high-resolution spectral analysis with fast measurement capabilities, user-configurable bandwidth settings, and multi-connector optical input flexibility to support diverse measurement requirements in laboratory and production environments.

## Technical Specifications

• **Wavelength Measurement Range:** 600 nm to 1750 nm (expandable bands available)
• **Wavelength Accuracy:** ±20 pm (1520–1620 nm); ±50 pm (1530–1570 nm)
• **Resolution Bandwidth:** Minimum 30 pm with selectable resolutions of 0.03, 0.05, 0.07, 0.1, 0.2, 0.5, and 1.0 nm
• **Dynamic Range:** ≥60 dB (0.4 nm from peak wavelength)
• **Optical Reception Sensitivity:** –87 dBm noise floor
• **Measurement Speed:** <0.2 s for passive optical devices (5 nm span); up to 0.35 s for 30 nm wavelength sweep in Fast mode

## Key Features

• Built-in wavelength reference light source for ±20 pm accuracy (1530–1570 nm)
• User-replaceable optical connectors: FC, SC, ST, and DIN types
• VGA output connector for external display integration
• GPIB interface for remote control and automated data transfer
• Selectable resolution bandwidth for optimized signal-to-noise performance across measurement ranges

## Typical Applications

• WDM system validation and troubleshooting
• Optical device characterization in R&D environments
• Manufacturing quality assurance for optical components
• Optical communication system performance analysis
• Passive optical device measurement and verification

## Compatibility & Integration

Multi-connector optical input accommodates standard industry connector types. GPIB control enables integration into automated test systems. VGA output supports real-time waveform monitoring on external displays.