Anritsu MS9701C Optical Spectrum Analyzer

The Anritsu MS9701C is a high-performance optical spectrum analyzer engineered for precise spectral characterization across 600 nm to 1750 nm, with enhanced performance in the L-band region (1570 nm to 1620 nm). It delivers wavelength, power level, and SNR measurements for up to 300 DWDM channels, along with PMD and EDFA noise floor analysis. The instrument measures laser diode and LED spectra, passive optical element transmission characteristics, and noise figure plus gain of optical fiber amplifier systems. A built-in tunable laser source tracking function eliminates the need for external controllers, while optional internal light sources—including SLD, white light, and reference wavelength sources—streamline measurement workflows. The MS9701C succeeds the MS9710B with upgraded wavelength accuracy, improved resolution bandwidth, enhanced SNR measurement via left and right noise floor averaging, and wide dynamic range. High reception sensitivity and a proprietary diffraction grating deliver reliable performance and exacting level and wavelength specifications across the WDM band. Built-in attenuator accommodates high-power optical inputs. Option 15 specifically optimizes wavelength accuracy, resolution, power level flatness, and linearity for the 1570 nm to 1620 nm L-band region. Remote control operation integrates with external controllers for automated measurement sequences.

## Technical Specifications

• **Wavelength Range:** 600 nm to 1750 nm
• **L-Band Performance:** Enhanced specifications for 1570 nm to 1620 nm region
• **DWDM Channel Analysis:** Wavelength, power level, and SNR measurement of up to 300 channels
• **Measurement Functions:** PMD, EDFA noise floor, laser diode and LED spectra, passive optical element transmission, noise figure, and gain of optical amplifiers

## Key Features

• High wavelength accuracy with improved resolution bandwidth
• Signal-to-noise measurement with left and right noise floor averaging
• Built-in tunable laser source tracking for integrated measurement control
• Built-in attenuator for high-power optical input handling
• Optional internal light sources: SLD, white light, and reference wavelength sources
• One-button calibration via internal reference wavelength source
• Wide dynamic range and high reception sensitivity
• Proprietary diffraction grating for reliability and performance across WDM bands
• Option 15 optimization for L-band wavelength accuracy, resolution, power flatness, and linearity

## Typical Applications

• Optical communication system characterization
• DWDM channel analysis and validation
• Optical fiber amplifier performance assessment
• Laser diode and LED spectral measurement
• Passive optical component transmission analysis
• Research and development in photonics

## Compatibility & Integration

• Remote control operation via external controller or computer interface
• Anritsu tunable laser source integration without external controller requirement