Exfo IQ-5320 Multi-Wavelength Meter

The EXFO IQ-5320 is a precision multi-wavelength meter engineered for simultaneous measurement of central wavelength and optical power across up to 200 multiplexed channels. Built on a scanning Michelson interferometer architecture, it delivers wavelength accuracy superior to traditional optical spectrum analyzers—ideal for DWDM channel verification and power mapping in production and field test environments.

## Technical Specifications

• **Wavelength Range:** 1450 nm to 1650 nm
• **Wavelength Uncertainty:** ±0.003 nm absolute; ±0.002 nm typical; ±0.005 nm maximum
• **Wavelength Display Resolution:** 0.001 nm
• **Wavelength Repeatability:** ±0.001 nm
• **Wavelength Measurement Resolution:** 0.001 nm
• **Channel Discrimination:** <0.06 nm (similar power); <0.2 nm (dissimilar power)
• **Optical Power Range:** +10 dBm to −45 dBm
• **Power Display Resolution:** 0.01 dB
• **Optical Power Accuracy:** ±0.35 dB; ≤±0.1 dB at 25°C, 1550 nm, −10 dBm
• **Optical Power Repeatability:** ±0.1 dB
• **Optical Power Flatness:** <0.2 dB
• **Optical Power Linearity:** <0.1 dB (−20 to +10 dBm); 23 dB
• **Return Loss:** >40 dB (APC connector)
• **Polarization Dependence:** <0.4 dB
• **Simultaneous Channels:** Up to 200
• **Physical Size:** 12.5 cm H × 7.4 cm W × 28.2 cm D; 15 lbs

## Key Features

• Spectrum view window with Fabry-Perot modal distribution display
• Zoom and marker functions for detailed spectral analysis
• Average acquisition mode for improved signal-to-noise performance
• Drift mode for long-term wavelength and power variation tracking
• Raw spectrum data output for proprietary algorithm integration

## System Integration

Operates as a PC-based module within EXFO's IQS-500 Intelligent Test System. Data acquisition via GPIB standard interface. LabVIEW drivers and ActiveX libraries support custom applications in networked PC environments. Backward-compatible with most IQ-generation modules.

## Typical Applications

DWDM system verification, optical channel power mapping, production test automation, wavelength and power characterization.