The EXFO IQS-505P-N10-I3-G1 is a 5-slot intelligent control unit that serves as the hub for EXFO IQS modular test systems. It integrates power management, system connectivity, and a graphical user interface to deliver centralized test control in laboratory and production environments. Built on standard industrial PC architecture with a Pentium III processor, the unit supports expansion up to 100 total modules through connection of up to nine IQS-510E expansion units, enabling flexible test system scaling without redesign.
– Technical Specifications
• Processor: Pentium III (866 MHz for system management)
• Display: 8.4-inch TFT color touchscreen
• Module slots: 5 slots for plug-in test modules
• Power input: 110-120/210-240 V AC, 50/60 Hz
• Data bus: EXFO Bus II for high-speed inter-unit communication
• Maximum system capacity: 100 modules (with nine IQS-510E expansion units)
– Key Features
• 8.4-inch TFT touchscreen with local scrolling knob for manual operation
• 10/100 Base-T Ethernet, RS-232 serial, parallel, and USB (2x) ports
• External monitor and keyboard/mouse inputs for remote operation
• Optional GPIB interface (IEEE 488.2) supporting single-address control of up to 100 modules
• IQS Manager software compatible with Microsoft Windows 2000 Professional
• Backward compatibility with IQ-200 Optical Test System modules
– Key Features
• Modular plug-in test configuration for application-specific setups
• Scalable architecture supporting multi-unit expansion via EXFO Bus II
• Dual control: local touchscreen operation and remote Ethernet/GPIB access
• High-density test environments in both benchtop and integrated automated systems
– Compatibility & Integration
The IQS-505P-N10-I3-G1 integrates with the IQS-500 series modular ecosystem. Up to nine IQS-510E expansion units extend the system to 100 total modules. The unit maintains backward compatibility with IQ-200 Optical Test System modules and communicates across all connected units via EXFO Bus II. Standard Ethernet and optional GPIB interfaces enable remote control and integration into broader test automation frameworks.
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