Fluke 80TK

The Fluke 80TK Thermocouple Module transforms any compatible digital multimeter into a precision thermometer for Type-K thermocouple measurements. It converts thermocouple millivolt output to direct temperature readings at a 1 mV per degree Celsius or Fahrenheit ratio, enabling temperature monitoring across -50 to 1000 °C (-58 to 1832 °F) with selectable scale output. The module accepts standard mini-thermocouple connectors and bare wire leads, operating from a single 9V battery with approximately 1600+ hours of operational life.

## Technical Specifications

• **Measurement Range:** -50 to 1000 °C (-58 to 1832 °F), probe dependent
• **Temperature Scales:** Selectable °C or °F via three-position switch
• **Output Conversion:** 1 mV per degree Celsius or Fahrenheit
• **Input Connector:** Standard mini-thermocouple connectors or bare wire leads
• **Maximum Input Voltage:** 60 V DC / 24 V AC at thermocouple input
• **Power:** Standard 9V battery (NEDA #1604, 6F22, 006P); 1600+ hours runtime
• **Resolution:** Dependent on DMM count (0.1 °C/F in lower mV/V ranges; 1.0 °C/F in higher ranges)
• **Basic Accuracy:** 0.5% of reading ± 2 °C (-20 to 350 °C); 1.75% of reading ± 2 °C (351 to 500 °C); 2.0% of reading ± 2 °C (501 to 1000 °C); 2.5% of reading ± 2 °C typical (-50 to -21 °C)
• **Temperature Coefficient:** Multiply basic accuracy by 0.1 for each degree ambient temperature above 28 °C or below 18 °C (0 to 50 °C range)

## Key Features

• Direct temperature display in °C or °F with user-selectable output
• Extended measurement range suitable for industrial and laboratory thermal monitoring
• Flexible probe connectivity supporting both connectorized and bare wire configurations
• Long battery life reduces replacement frequency in field applications
• Low-voltage design with defined input voltage limits

## Compatibility & Integration

The 80TK operates with any digital multimeter featuring 10 MΩ or greater input impedance and a millivolt DC measurement scale. This broad compatibility enables integration into existing test setups without requiring dedicated instrumentation.