HP 37717B W AIP,A3D,UH2,UH4,UKK,US1

The HP 37717B is a multi-rate bit error measuring test set for comprehensive testing and verification of communication systems and networks. It generates and receives data patterns with G.821-compliant error analysis, supporting AMI, HDB3, and CMI coding schemes. The instrument delivers accurate error measurements in the presence of signal degradation, including half-rate cable loss up to 12 dB. This configuration includes options A1P, A3D, UH2, UH4, UKK, and US1, enabling advanced PDH/SDH and ATM testing across multiple rates and interfaces.

– Technical Specifications

Data Interfaces
• 75-ohm unbalanced data interfaces (all data rates)
• 120-ohm balanced data interfaces (up to 2.048 Mbit/s)
• PC-type optical connector interface; optical interface connectors from 81000xI Series sold separately

PDH Data Rates
• 2 Mb/s, 8 Mb/s, 34 Mb/s, 140 Mb/s

SDH Rates
• STM-1 (155 Mb/s)
• STM-4 (622 Mb/s)

Error Measurement
• G.821-compliant error analysis
• Tolerance up to 12 dB half-rate cable loss
• Operation at protected monitor points

– Key Features

Jitter Capabilities
• PDH and SDH jitter generation
• PDH jitter measurement at 2, 8, 34, and 140 Mb/s
• STM-1e line and PDH jitter measurement
• STM-1o and STM-1e line jitter measurement
• SDH jitter measurement at STM-1 and STM-4 optical rates (Option A1P)
• Wander measurement support

Coding Schemes
• AMI, HDB3, CMI (rate-dependent)

Included Options
• Option A1P: SDH jitter measurement at STM-1 and STM-4 optical rates
• Option A3D: Advanced testing capabilities
• Option UH2: STM-1/STM-4 optical interface for SDH options
• Option UH4: SDH/PDH optical interface functionality
• Option UKK: Unstructured PDH generation and measurement
• Option US1: STM-1 electrical SDH signal generation and analysis with SDH frequency offset measurement

– Typical Applications

• PDH/SDH network testing and verification
• ATM system performance characterization
• Jitter and wander analysis across multiple transmission rates
• Error rate measurement under degraded signal conditions

– Compatibility & Integration

Optical interface connectors from the 81000xI Series are available as separate purchases to expand measurement capabilities across STM-1 and STM-4 optical rates.