HP 8350B and 83592A 10 MHz -20 GHz sweep generator Calibrated

The HP 8350B Sweep Generator Mainframe paired with the HP 83592A RF Plug-in delivers precise RF and microwave signal generation across 10 MHz to 20 GHz. This calibrated system combines microprocessor control with broad frequency coverage and configurable output power for laboratory and field testing. Five independent markers with difference computation, nine state storage registers, and multiple sweep modes—internal, line-triggered, external trigger, single, manual, and external voltage-controlled—enable complex measurement routines. Sweep time adjusts continuously from 10 ms to 100 seconds. CW mode provides single-frequency output with 0.00038% frequency resolution (262,144 points across band) and ±0.05% vernier adjustment. Internal AM modulation operates at factory-preset 27.8 kHz or field-selectable 1000 Hz. External sweep input accepts 0 to +10 V ramps; external trigger requires >+2 V, >0.5 µs pulse width, +2 V, >0.5 µs width, <1 MHz frequency
• Markers: Five independent, continuously variable; marker D computes difference; Marker CF and Marker Sweep functions
• State Storage: Nine registers for complete front panel states
• Operating Temperature: 0°C to +55°C
• Power Input: 100, 120, 220, or 240 V ±10%, 50–60 Hz

– Key Features

• Microprocessor-controlled mainframe with high-resolution digital frequency and power displays
• Six sweep trigger modes: internal, line, external trigger, single, manual, and external voltage control
• Nonvolatile memory preserves instrument state, HP-IB address, and configuration on power loss
• Full HP-IB programmability of mainframe functions
• CW accuracy and output power specifications determined by RF plug-in

– Typical Applications

• RF and microwave component characterization
• Frequency response testing of amplifiers and filters
• Swept-frequency system calibration
• Laboratory measurement and validation

– Compatibility & Integration

Works with HP 83592A RF Plug-in (10 MHz–20 GHz). HP-IB interface enables remote control and automated test sequences.