The HP/Agilent 3314A is a programmable function generator delivering sine, square, triangle, ramp, and pulse waveforms from 0.001 Hz to 19.99 MHz, with ramp and pulse capabilities to 2 MHz. It generates arbitrary waveforms from user-defined vectors stored in non-volatile memory and supports amplitude outputs from 0.01 mVp-p to 10 Vp-p into 50 Ω, expandable to 30 Vp-p into loads exceeding 500 Ω with Option 001. Independent ±5 V DC offset can be applied to any AC signal using post-attenuator summing. Variable symmetry control (5% to 95%) enables pulse generation with rise/fall times as low as 9 ns for digital circuit testing and positive or negative ramps for amplifier characterization.
The instrument integrates AM and FM/VCO modulation at 100 kHz bandwidth, linear and logarithmic sweeping, and multiple trigger modes including N-cycle burst (1 to 1999 cycles), gate mode, and 1/2-cycle generation. Phase lock synchronization (XN and ÷N) and variable start/stop phase control support specialized waveform synthesis. Frequency accuracy reaches 0.01% on upper ranges with sine distortion below −55 dBc to 50 kHz. Internal triggering spans 0.5 mHz to 500 kHz; external triggering is supported for burst and gate modes with trigger output for device synchronization. Full HP-IB programmability integrates the 3314A into automated test equipment and complex measurement systems.
## Technical Specifications
• **Frequency Range:** 0.001 Hz to 19.99 MHz (sine, square, triangle); ramp and pulse to 2 MHz
• **Amplitude:** 0.01 mVp-p to 10 Vp-p into 50 Ω; optional 30 Vp-p into >500 Ω with Option 001
• **DC Offset:** Independent ±5 V into 50 Ω
• **Frequency Accuracy:** 0.01% on upper ranges
• **Sine Distortion:** <−55 dBc to 50 kHz
• **Symmetry Control:** 5% to 95% (ramps and pulses)
• **Pulse Rise/Fall Time:** As low as 9 ns
• **Arbitrary Waveforms:** Up to 150 vectors with non-volatile storage
• **Modulation Bandwidth:** 100 kHz (AM and FM/VCO)
• **Burst Mode:** 1 to 1999 cycles
• **Internal Trigger Range:** 0.5 mHz to 500 kHz
## Key Features
• Variable symmetry for narrow pulse and ramp generation
• N-cycle burst and gate modes for signal sequencing
• Phase lock and variable start/stop phase for synchronized outputs
• Linear and logarithmic sweep with manual control
• Arbitrary waveform generation with persistent memory
• AM and FM/VCO modulation usable separately or simultaneously
• External and internal triggering with synchronization output
## Typical Applications
• Digital circuit testing with sub-nanosecond pulse generation
• Filter and amplifier network characterization via frequency sweeps
• Sonar and transducer signal simulation
• Process control and feedback loop testing
• Automated test environments requiring synchronized multi-instrument operation
## Compatibility & Integration
• HP-IB programmable interface for all front panel controls
• Suitable for automated test systems and benchtop integration
• Trigger output for external device synchronization





















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