HP / Agilent 4145A Semiconductor Parameter Analyzers

The HP/Agilent 4145A Semiconductor Parameter Analyzer is a programmable DC characterization instrument for measuring and analyzing voltage, current, and resistance parameters across semiconductor devices. It delivers fully automatic stimulus and measurement capability through four configurable SMUs, two programmable voltage sources, and two voltage monitors, enabling precise device evaluation from component-level testing through process control applications.

## Technical Specifications

**Stimulus/Measurement Capabilities:**
• Four programmable SMUs (voltage/current source modes or ground configuration)
• Source voltage range: 1 mV to 100 V
• Source current range: 1 pA to 100 mA
• Voltage and current sourcing with automatic monitoring of complementary parameter
• Linear and logarithmic sweep capability for both source voltage and current
• Two independent voltage source units (Vs1, Vs2)
• Two independent voltage monitor units (Vm1, Vm2)

**Display and Analysis:**
• Graphics-based measurement display with marker and cursor readout
• Line function with automatic gradient and axis intercept calculation
• Multiple display formats: Graphic, List, Matrix, and Schmoo plots
• Double-Y-axis graphing capability
• Microprocessor-controlled interactive display

**Measurement Data:**
• Buffer memory capacity: 570 measurements maximum
• Removable flexible-disc drive for program and results storage

## Key Features

• Front-panel softkeys for direct operation control
• Menu-driven programming interface with arithmetic keyboard
• Sequential program support (up to 24 operations)
• Three pre-loaded measurement programs: B-Tr Vce-Ic, Fet Vds-Id, Diode Vf-If
• I-V curve characterization for two-terminal devices
• Id-Vds-Vg three-dimensional analysis for MOSFETs
• Logic gate switching characteristic measurement

## Typical Applications

• Discrete semiconductor device characterization (diodes, BJTs, FETs)
• Integrated circuit parameter extraction and verification
• Wafer-level DC measurements
• Incoming and outgoing component inspection
• Semiconductor process monitoring and control
• Materials analysis and component selection
• Computer-aided IC design validation

## Connectivity & Integration

• HP-IB (Hewlett-Packard Interface Bus) standard interface