HP / Agilent 4156B Semiconductor Parameter Analyzers

The HP/Agilent 4156B Precision Semiconductor Parameter Analyzer delivers high-resolution electrical characterization of discrete semiconductors and integrated circuits across research, development, design verification, and production test environments. This instrument combines four High Resolution Source/Monitor Units with specialized voltage and current sourcing, monitoring, and pulse generation capabilities to enable accurate parametric extraction and device behavior analysis. Its expandable architecture and integrated measurement functions support complex stress-measure sequences and reliability evaluations.

## Technical Specifications

**Measurement Ranges:**
• Current: 1 fA to 1 A; offset accuracy 20 fA
• Voltage: 1 µV to 200 V
• Voltage compliance: 0 V to ±100 V
• Current compliance: ±1 pA to ±100 mA (accuracy matches settling specifications)

**Source/Monitor Units — Standard Configuration:**
• Four High Resolution SMUs: ±100 V, ±1 pA to ±100 mA, 2 mV voltage resolution, 1 fA current resolution
• Two Voltage Source Units
• Two Voltage Monitor Units
• Expandable to six SMUs maximum

**Optional Expander (41501B SMU and Pulse Generator Expander):**
• Two synchronized 40 V pulse generators: 200 mA, 1 µs minimum pulse width
• Accommodates two 100 mA/100 V SMUs or one 1 A/200 V SMU
• Optional High Power SMU or two Medium Power SMUs
• 0 V/1.6 A Ground Unit

**Measurement Capabilities:**
• I-V sweep: fully automated DC and pulse modes
• Quasi-static C-V measurement: built-in
• Time-domain measurement: variable intervals from 60 µs, up to 10,001 points
• Full-Kelvin remote sensing on each SMU for low-resistance accuracy

## Key Features

• Stress/measure synchronized operation for hot carrier injection and flash EEPROM characterization
• Automated parameter extraction with graphical analysis tools (hFE, Vth)
• Knob sweep control for intuitive setup
• Color LCD display with four graphic memories for result superimposition

## Typical Applications

Diode and transistor parametric testing, threshold voltage extraction, leakage current measurement, reliability stress testing, and device design validation.

## Compatibility & Integration

The 4156B accepts external measurement instruments and expands through the 41501B expander module for increased channel count and pulse generation.