HP / Agilent 8013B 50 MHZ DUAL-OUTPUT PULSE GENERATOR

The HP/Agilent 8013B is a dual-output pulse generator delivering independent pulse control across two channels from 1 Hz to 50 MHz. It generates simultaneously positive and negative pulse trains with continuously adjustable width, delay, amplitude, and polarity, making it suitable for timing validation and digital circuit characterization across a wide range of electronic applications.

## Technical Specifications

**Frequency & Repetition Rate**
• Frequency range: 1 Hz to 50 MHz
• Repetition rate: continuously adjustable 1 Hz to 50 MHz in four ranges

**Pulse Parameters**
• Pulse width: continuously adjustable from <10 ns to 1 s
• Pulse delay: continuously adjustable from <35 ns to 1 s; minimum 17 ns typical
• Rise/fall time: fixed at 3.5 ns or variable from 5 ns to 0.5 s

**Output Characteristics**
• Output voltage: 0.2 V to 10 V into 50 Ω; maximum 16 V; adjustable via four-step attenuator down to 0.4 V
• Output impedance: 50 Ω ± 3% switchable; 50 Ω ± 3% shunted by typically 20 pF with internal load connected or switched out
• DC offset: ±2.5 V across 50 Ω with internal load connected; automatically switched off with internal load disconnected
• Output modes: normal, complement, and double pulse capability; square wave adjustable 0.5 Hz to 25 MHz in four ranges

**Timing Accuracy**
• Delay jitter: <0.1% + 50 ps
• Period jitter: 0.8 V either polarity with width >7 ns; maximum input amplitude 7 V
• External triggering capability up to 50 MHz
• Synchronous gating via gate input (>1.5 V or >1 kΩ to ground)
• Trigger output with 25 ns ± 8 ns delay from leading edge of trigger input
• Trigger input impedance: 50 Ω ± 10%, AC-coupled

## Typical Applications

• Logic circuit timing and validation
• Digital signal path characterization
• Timing measurements in test and measurement systems
• High-frequency pulse train generation and analysis

## Compatibility & Integration

The 8013B integrates external trigger and gate signals for synchronized multi-channel operation, with selectable source impedance matching standard 50 Ω test environments.