HP / Agilent 8018A 50 MBIT/S DATA GENERATOR, 2 CH X 1 KBIT

The HP/Agilent 8018A is a dual-channel serial data generator delivering programmable pattern generation up to 50 Mbits/s. With 2048 bits of total memory split into independent 1 Kbit channels, it produces clean 6 ns pulses in RZ/NRZ formats and supports PRBS sequences, custom patterns, and complex data link structures. The instrument provides variable output amplitude to 15 V into 50 Ω, TTL/ECL/CMOS logic compatibility, and flexible triggering across bit, word, frame, and manual modes. Channel A offers simultaneous normal and complement outputs; Channel B provides normal output. Jitter performance of 0.2% and overshoot/preshoot/ringing ≤ 10% (ECL ≤ 15%) ensure signal integrity in high-speed digital circuit testing. Synchronization outputs lock external instruments to specific data stream points. HP-IB control (Option 001) enables automated pattern loading and test sequencing. The compact 426 mm × 422 mm × 133 mm form factor operates on 100–240 Vrms and dissipates 230 V A maximum.

## Technical Specifications

• **Data Rate:** DC to 50 Mbits/s
• **Memory:** 2048 bits total (1 Kbit per channel, dual-channel configuration)
• **Pulse Width:** 6 ns
• **Output Amplitude:** Variable to 15 V into 50 Ω
• **Output Impedance:** Selectable 50 Ω or 1 kΩ
• **Jitter:** 0.2% (internal bit rate)
• **Signal Quality:** Overshoot/preshoot/ringing ≤ 10% (ECL ≤ 15%)
• **Operating Temperature:** 0°C to 50°C
• **Power Supply:** 100/120/220/240 Vrms ±5%, 48–440 Hz
• **Power Consumption:** 230 V A maximum
• **Dimensions:** 426 mm W × 422 mm D × 133 mm H
• **Weight:** 12 kg net; 16 kg shipping

## Key Features

• PRBS pattern lengths: 511, 1023, 32767, and 1048575 bits
• Programmable data patterns and preamble-data-postamble sequences
• RZ/NRZ output format selection
• Channel A: Normal and complement outputs; Channel B: Normal output
• Multiple triggering modes: bit, word, frame, and manual
• External clock, cycle, word trigger, first bit, and last bit inputs
• Synchronization outputs for instrument locking
• Continuous auto-cycling or single-sequence operation
• HP-IB (IEEE 488) interface for remote pattern loading

## Compatibility & Integration

Output logic levels support TTL, CMOS, and ECL circuits. Selectable 50 Ω or 1 kΩ output impedance accommodates both terminated and unterminated test environments. External triggering and clock inputs integrate with automated test systems.