HP / Agilent 8110A Pulse Pattern Generator, 150 MHz

The HP/Agilent 8110A Pulse Pattern Generator delivers programmable pulse generation from 1 Hz to 150 MHz, enabling precise testing of digital circuits and logic devices. This dual-channel instrument generates single pulses, complex digital patterns, and multilevel signals with independently variable parameters including amplitude, width, delay, and transition time. Dual BNC outputs with 50 Ω impedance support continuous, external-triggered, and gated operation modes.

## Technical Specifications

**Frequency and Timing**
• Frequency range: 1 Hz to 150 MHz
• Frequency accuracy: ±0.5% ± 150 ps typical
• Timing resolution: 10 ps
• Transition time: 2 ns typical
• Minimum pulse width: 3.3 ns
• Pulse width accuracy: ±0.5% ± 250 ps typical
• Delay range: 0 ns to (period – 6.6 ns), maximum 999 ms
• Delay accuracy: ±5% ± 1 ns

**Output Specifications**
• Amplitude: 100 mV to 10 Vpp into 50 Ω load; 200 mVpp to 20 Vpp into 1 kΩ load
• Amplitude resolution: 10 mV
• Output impedance: 50 Ω typical
• Pattern memory: 16 kbit per channel

**External Triggering**
• External input voltage: ±15 Vpp maximum
• Input sensitivity: ≤300 mVpp typical
• Input frequency range: DC to 150 MHz
• Input impedance: 50 Ω
• Trigger modes: Continuous, external-triggered, external gate, external width, manual

## Key Features

• Single- and dual-channel output configuration
• RZ/NRZ (Return-to-Zero/Non-Return-to-Zero) operating modes
• Three- and four-level signal generation
• Internal PLL for clock recovery
• SCPI programming commands supported
• Graphic and LED display interfaces
• Compact form factor

## Typical Applications

• Digital circuit and logic device characterization
• High-speed digital system testing
• Complex pattern generation for timing analysis
• Functional validation of TTL and ECL logic families

## Compatibility & Integration

BNC connectors provide standard 50 Ω RF connectivity. Two output channels and one input channel enable flexible test configurations. SCPI command support enables remote operation and integration into automated test systems.