JDS Uniphase Benchtop Mainframe MAP+2B00

The JDS Uniphase MAP+2B00 is a benchtop mainframe for optical testing and measurement applications. It provides a stable platform for housing hot-swappable instrumentation cassettes, enabling users to build customized test solutions for evaluating optical components, modules, and systems. Part of the Multiple Application Platform (MAP) series, the MAP+2B00 delivers flexible, scalable instrumentation in a compact 9.5-inch form factor ideal for lab bench deployments. Dynamic MAP firmware automatically identifies installed cassettes, and the common backplane supports over 15 different module types without requiring system power-down during insertion or removal.

– Technical Specifications

• Chassis: Benchtop mainframe, 9.5-inch width
• Slot Capacity: 3 single slots for instrumentation cassettes
• Module Compatibility: Hot-swappable backplane supporting over 15 instrumentation cassette types; modules insertable and removable without power-down
• Firmware: Dynamic identification of installed cassettes
• User Interface: 9-key keypad with color display; external USB keyboard compatible
• Communication Ports: RS-232, GPIB, USB, Ethernet 10/100/1000Base-T
• Clock Configuration: CLK1 line configurable for internal or external generation
• Field-Replaceable Components: Controller, power supply, keypad/display, and remote interface modules

– Key Features

• Hot-swappable architecture eliminates downtime during module changes
• Compact benchtop configuration with optional 19-inch rackmount kit for rack integration
• Remote communication integration for automated test environments
• IVI-compliant drivers with LabVIEW, LabWindows, Visual C++, and Visual Basic support
• PC-based MAP Console program with ActiveX and DLL libraries
• Software portability: applications developed for MAP Benchtop transfer directly to MAP Master mainframes without modification

– Typical Applications

• Optical component and module characterization
• System-level optical testing and validation
• Wavelength-dependent attenuation measurement using hot-swappable optical attenuator cassettes
• Polarization and fiber-based optical testing

– Compatibility & Integration

The MAP+2B00 integrates into automated test systems via RS-232, GPIB, USB, and Gigabit Ethernet interfaces. IVI-compliant drivers and LabVIEW support enable integration into standard test frameworks. Simulation mode supports offline development and validation.