JDS Uniphase MAP-OPM (MAPM+2PS11)

The JDS Uniphase MAP-OPM (MAPM+2PS11) is a modular optical power meter module for the MAP-200 platform, delivering precision InGaAs-based measurements across single, dual, or quad channel configurations. Deploy as a panel-mount or remote-head detector to match your integration architecture. The module supports wavelength coverage from 800 nm to 1650 nm (expandable to 750–1700 nm in select configurations) with dynamic range from −70 dBm to +27 dBm depending on grade selection. High sampling at 250 kHz and 100,000-point memory depth per sensor enable transient capture and waveform logging. Extremely low PDL and 35 dB optical return loss ensure measurement fidelity in demanding optical test environments.

## Technical Specifications

**Optical Performance**
• Wavelength range: 800 nm to 1650 nm (general purpose); 750 nm to 1700 nm (select configurations)
• Measurement range: −70 dBm to +10 dBm (general purpose); −80 dBm to +10 dBm (high-performance); up to +27 dBm (high-power)
• Detector type: Indium Gallium Arsenide (InGaAs)
• Detector size: 2 mm (general purpose head)
• Optical return loss: 35 dB (input and output ports)
• Polarization dependent loss: Extremely low

**Electrical & Data**
• Sampling rate: Up to 250 kHz
• Array capture: 100,000 points per optical sensor
• Optical connectors: FC/APC or SC/APC (configuration dependent)
• RF input connectors: GPO (for modulator compatibility)

**Environmental**
• Operating temperature: 0 °C to 75 °C
• Storage temperature: −40 °C to 85 °C

## Key Features

• Three performance grades—General Purpose, High-Performance, and High-Power—for application-specific requirements
• Flexible multi-channel architecture: single, dual, or quad configurations
• Panel-mount or remote-head deployment options
• High sampling rate and deep memory suitable for transient events and detailed logging
• Compatible with high-speed Mach-Zehnder modulators
• Single-sided electrical I/O on select configurations

## Typical Applications

• Optical power measurement in WDM and CWDM systems
• High-speed modulation characterization
• Real-time signal monitoring and transient capture
• Extended-range measurements from −80 dBm to +27 dBm

## Compatibility & Integration

Designed for the JDS Uniphase MAP-200 platform. Module-level design enables sharing and stacking within the chassis, protecting investment in earlier MAP-generation equipment. Integrates with other MAP modules for compound test configurations.