JDS Uniphase MAP+2B00

The JDS Uniphase MAP+2B00 is a 3-slot benchtop mainframe for optical test and measurement applications. This modular platform accepts over 15 hot-swappable instrumentation cassettes, enabling custom configurations with optical spectrum analyzers, optical power meters, optical time domain reflectometers, tunable filters, laser sources, and switch modules. The unit features a color display, 9-key keypad, and remote communication via GPIB, USB, and Ethernet 10/100/1000Base-T (LXI-compliant). With a 9.5-inch width, it operates as a standalone benchtop instrument or integrates into larger systems; an optional 19-inch rack-mount kit is available. Software applications developed on the MAP Benchtop transfer directly to MAP Master configurations without modification.

## Technical Specifications

• **Form Factor:** Benchtop
• **Chassis Capacity:** 3 single-slot configuration
• **Display:** Color
• **User Interface:** 9-key keypad
• **Dimensions:** 9.5-inch width
• **Power Supply:** AC power
• **Remote Communication Ports:** GPIB, USB, Ethernet 10/100/1000Base-T (LXI-compliant)
• **Hot-Swappable Cassettes:** Over 15 instrumentation types supported

## Key Features

• Modular architecture supports optical spectrum analyzers, optical power meters, optical time domain reflectometers, DFB laser sources, ASE output modules, LED-based light sources, attenuator cards, and switch modules
• Hot-swappable cassette design allows module replacement without system shutdown
• TB3 Tunable Filter module: 1420–1630 nm wavelength range, 300 mW input power, 0.55 nm bandwidth (Model K)
• Optional MAP+2A10 rack-mount kit enables 19-inch rack integration

## Compatibility & Integration

• **Software:** LabVIEW, LabWindows, Visual C++, Visual Basic drivers
• **IVI Drivers:** Available for instrument interchangeability
• **Platform Migration:** Applications developed for MAP Benchtop transfer to MAP Master without modification

## Typical Applications

Optical spectrum analysis, optical power measurement, optical time domain reflectometry, wavelength-selective filtering, and multi-function optical test configurations in laboratory and system integration environments.