JDS Uniphase MAPS+2W731T1FP

The JDS Uniphase MAPS+2W731T1FP is a multi-application platform mainframe chassis designed to host hot-swappable instrumentation cassettes for optical testing and measurement. This modular architecture supports over 15 different types of specialized cards, enabling users to configure the system for diverse applications without powering down during module installation or replacement. The platform accommodates various optical test functions—from signal routing and wavelength tuning to amplification and attenuation—in a single integrated chassis.

## Technical Specifications

• **Modularity:** Hot-swappable instrumentation cassettes (cards)
• **Module Compatibility:** Over 15 different types of instrumentation cassettes
• **Hot-Swap Capability:** Modules can be inserted or removed without system shutdown

## Key Features

• **Optical Switches:** Configurable routing with matrix and single-input multi-output topologies. Up to 50 channels available. Options for single or dual-switch configurations per slot, with up to eight switches per cassette slot. Low insertion loss and high return loss performance.
• **Tunable Laser Sources:** Stable light sources with internal and external modulation capabilities and variable power control. Modulation bandwidth to 1 GHz.
• **Attenuators:** High-resolution, wide wavelength range designs. Available with 1 or 2 devices per cassette. Single-mode or multimode fiber options with tap or power control features.
• **Erbium-Doped Fiber Amplifiers (EDFA):** C-band and L-band configurations. Saturated output power from 14 dBm to 21 dBm. Noise figure as low as 3.3 dB. Gain flatness better than 1.4 dB.
• **Tunable Grating Filters:** Continuous wavelength tuning from 1420 nm to 1630 nm. Standard models support up to 300 mW input power.

## Compatibility & Integration

The MAPS+2W731T1FP is part of the JDS Uniphase MAP series, which includes 19-inch 8-slot Master chassis and 9.5-inch 3-slot Benchtop configurations. The modular design enables flexible system scaling for telecommunications, optical component testing, and photonic measurement applications.