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JTAG Technologies JT3707/TSI DataBlaster Boundary-Scan Controller

SKU: JT3707/TSICategories: Embedded Test Systems
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The JTAG Technologies JT3707/TSI DataBlaster is a high-performance boundary-scan controller designed for demanding applications. It offers advanced features and capabilities for testing and programming complex electronic devices and systems.

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$2,400.00

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Equipment info

The JTAG Technologies JT3707/TSI DataBlaster is a boundary-scan controller for IEEE 1149.1 testing and in-system programming (ISP). It delivers sustained test clock speeds to 40 MHz with programmable TCK adjustment from 500 Hz to maximum, enabling flexible performance tuning for complex, high-density PCBs. The triple-serial interface (TSI) provides USB 2.0 (480 Mbit/s), USB 1.1 (12 Mbit/s), Ethernet, and FireWire (IEEE-1394-1995 and IEEE-1394A-2000) connectivity at 100, 200, and 400 Mbit/s operation, supporting integration across diverse computing platforms.

## Technical Specifications

**Core Capability:** IEEE 1149.1 boundary-scan testing and in-system flash programming

**Test Clock (TCK):** 40 MHz sustained; programmable from 500 Hz to maximum; automatic speed matching for optimal chain performance

**Connectivity Interfaces:**
• USB 2.0 at 480 Mbit/s and USB 1.1 at 12 Mbit/s
• Ethernet
• FireWire (IEEE-1394-1995 and IEEE-1394A-2000) at 100, 200, and 400 Mbit/s

**TAP Architecture:** Four synchronized test access ports via included JT 2147 QuadPOD system; each TAP pod (JT 2149) features a 20-way TAP connector and eight-pin connector for four static I/O lines

**TAP Voltage Range:** 1.0 V to 3.6 V, individually programmable per TAP

**Flash Memory Buffer:** Expandable up to 128 Mbits

**QuadPOD System (JT 2147):** Bench-top signal conditioning module comprising JT 2148 transceiver and four removable JT 2149 TAP pods, connected via 50-way shielded cable assembly

## Key Features

• Scalable architecture upgradeable to JT3717 with JT 2108 ETT (Enhanced Throughput Technology) module
• Optimized binary file format (BSX) for high-speed execution
• Optional SCIL measurement modules and JT 2149/DAF (Digital/Analog/Frequency) modules for expanded capability
• Full compatibility with existing JTAG Technologies test and ISP files

## Typical Applications

Board testing, CPLD programming, fast in-system flash memory programming, vector-intensive manufacturing test, and engineering environments with small-to-large data block requirements

## Compatibility & Integration

Fully compatible with existing JTAG Technologies test and ISP file libraries. Low-voltage TAP system supports modern embedded and FPGA device ecosystems.

MPN

JT3707/TSI

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Product Condition & Availability
JTAG Technologies JT3707/TSI DataBlaster Boundary-Scan Controller is in excellent working condition and has been thoroughly tested for performance and reliability. We offer both new and professionally refurbished options, depending on availability and customer preference.

 

Integrated Solutions & Deployment Support
Beyond individual products, Aumictech provides end-to-end solutions for manufacturing line deployment and test station setup. Our team can assist with system integration, configuration, and equipment selection tailored to your production requirements.

Trusted Industry Experience
With over a decade of experience, Aumictech is a recognized leader in RF and optical test equipment sales and services. All units are supported by our in-house calibration and repair facility based in Downingtown, PA, ensuring technical reliability and long-term value.

Customer Commitment
We’re committed to exceptional customer service, offering a 15-day return or replacement (ROR) policy for peace of mind. Our team is always available to assist with pre- and post-sale support.

Fast Shipping & Flexible Payments
We offer rapid global shipping through FedEx, UPS, and DHL, with most orders dispatched within 1–3 business days. Multiple secure payment options are available, including PayPal, ACH, wire transfers, and major credit cards.

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