The Keithley 2470 is a graphical high-voltage SourceMeter SMU engineered for precise sourcing and measurement of voltage and current in demanding characterization applications. It sources up to ±1100 V and measures down to 10 mA with exceptional accuracy, making it ideal for semiconductor, advanced materials, and high-voltage device testing across research, development, and production environments.
– Technical Specifications
Voltage Source
• Range: ±1100 V
• Resolution: 1 mV (typical)
• Accuracy: ±0.1% of reading + 0.5% of range (typical)
Current Source
• Range: 10 mA (maximum)
• Resolution: 1 µA (typical)
• Accuracy: ±0.2% of reading + 0.5% of range (typical)
Voltage Measurement
• Range: ±1100 V
• Resolution: 1 mV (typical)
• Accuracy: ±0.1% of reading + 0.5% of range (typical)
Current Measurement
• Range: 10 mA (maximum)
• Resolution: 1 µA (typical)
• Accuracy: ±0.2% of reading + 0.5% of range (typical)
– Key Features
• 5-inch color touchscreen GUI with real-time I-V curve plotting and data visualization
• Linear, logarithmic, and custom sweep capabilities with programmable points and step size
• Configurable pulse generation for transient response testing
• Automated contact check prior to test execution
• Embedded ARM processor supporting SCPI and TSP scripting
• USB 2.0 (Device and Host), LXI-compliant Ethernet (10/100/1000 Base-T), optional GPIB, and digital I/O
• Onboard memory for test configurations and measurement data; CSV export
• Operating temperature: 0 °C to 50 °C; humidity: 20% to 80% RH (non-condensing)
• Input power: 100 V to 240 V AC, 50/60 Hz
– Typical Applications
Semiconductor characterization, advanced materials testing, high-voltage device evaluation, I-V curve analysis, and production quality assurance requiring high voltage precision and comprehensive data handling.



















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