Keithley 2602B System Sourcemeter SMU Instrument

The Keithley 2602B System SourceMeter SMU Instrument is a dual-channel precision source-and-measure unit designed for voltage and current characterization across semiconductor, optoelectronic, and power device applications. The instrument combines a precision power supply, current source, 6½-digit digital multimeter, arbitrary waveform generator, pulse generator, and electronic load in a single integrated platform.

– Technical Specifications

Source and Measurement Capabilities
• Two independent channels; 200 W total power (40.4 W maximum per channel)
• Voltage source/measure range: ±40 V; resolution 100 nV
• DC current source/measure range: ±3 A; pulse current range ±10 A
• Current measurement resolution: 100 fA
• Dynamic range: 0.1 fA to 10 A (pulse) or 3 A (DC) for current; 100 nV to 40 V for voltage
• 4-quadrant source/sink operation with single-value bipolar compliance (minimum 10 mV voltage, 10 nA current)

Electrical Performance
• Voltage regulation: 0.01% of range (line); ±(0.01% of range + 100 µV) load
• Current regulation: 0.01% of range (line); ±(0.01% of range + 100 pA) load
• Noise: < 20 mV peak-peak (typical, 6 V range); < 3 mV RMS (typical, 6 V range)
• Temperature coefficient: ±(0.15 × accuracy specification)/°C for 0–18°C and 28–50°C
• Source settling time: < 70 µs for output recovery within 0.1% on 10–90% load step

Pulse Characteristics
• Programmable pulse width: 100 µs minimum, 1 µs resolution
• Pulse width accuracy: ±5 µs
• Pulse width jitter: 2 µs

– Key Features

• Test Script Processing (TSP) technology embeds complete test programs directly in the instrument for enhanced system throughput
• TSP-Link expansion enables parallel testing without mainframe requirement
• 6½-digit measurement resolution for precision characterization
• Maximum output power combinations: ±40.4 V @ ±1.0 A, ±6.06 V @ ±3.0 A, ±1.01 A @ ±40.0 V, ±3.03 A @ ±6.0 V

– Typical Applications

• Semiconductor device characterization and parametric testing
• LED and optoelectronic component evaluation
• Power device and discrete component testing
• Circuit performance validation requiring multi-function test capability