Keithley 2634B System Sourcemeter SMU Instrument

The Keithley 2634B is a dual-channel System SourceMeter SMU instrument that combines a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator, pulse generator, and electronic load into a single integrated unit. It sources and measures voltage and current simultaneously across four quadrants, delivering 30.3 W per channel (60 W total) with exceptional resolution and accuracy.

– Technical Specifications

Voltage Source and Measurement
• Voltage Range: ± 200 mV to ± 200 V
• Maximum Output Voltage: 202.3 V
• Voltage Measurement Resolution: 100 nV
• Voltage Accuracy (200 mV range): 0.02% + 375 µV (Reading)
• Voltage Regulation: ± (0.01% of range + 100 µV)
• Voltage Limit/Compliance: Bipolar, minimum 20 mV
• Overshoot (source range change): <300 mV + 0.1% of larger range (typical)

Current Source and Measurement
• Current Range: ± 1 nA to ± 10 A
• Maximum DC Current: 1.5 A
• Maximum Pulse Current: 10 A
• Current Measurement Resolution: 1 fA
• Current Accuracy (100 pA range): ± (0.15% + 750 fA)
• Current Regulation: ± (0.01% of range + 100 pA)
• Current Limit/Compliance: Bipolar, minimum 10 nA

Pulse Characteristics
• Minimum Pulse Width: 1 µs
• Pulse Width Jitter: 2 µs
• Pulse Width Accuracy: ± 5 µs

Performance Parameters
• Channels: 2
• Output Power per Channel: 30.3 W
• Total Output Power: 60 W
• Operation: Four-quadrant voltage and current source and measure
• Standard Conditions: 18 °C to 28 °C, <70% relative humidity, after 2-hour warm-up
• Calibration Period: One year

– Key Features

• True four-quadrant operation enables simultaneous sourcing and sinking
• 6½-digit resolution supports high-precision component and device characterization
• Integrated arbitrary waveform and pulse generation eliminates external instrumentation
• Dual channels support parallel testing workflows
• Voltage and current measurements with independent compliance limits

– Typical Applications

• Research and development characterization of semiconductors and electronic components
• Automated test systems for semiconductor parametric testing
• Bench-top measurements requiring simultaneous voltage and current control
• Device curve tracing and reliability assessment

– Compatibility & Integration

The 2634B integrates sourcing and measurement functionality into a single chassis, reducing bench footprint while maintaining independent per-channel control and measurement capability.