The Keithley 2790-HH SourceMeter Switch System combines integrated sourcing, measurement, and switching capabilities in a single modular platform. It delivers precision voltage and current generation alongside comprehensive multimeter functions and configurable relay, multiplexer, and matrix switching for automated component and circuit characterization. Built for production and laboratory environments, the system supports GPIB, Ethernet, and USB connectivity.
– Technical Specifications
Digital Multimeter Functions
• Voltage: DC 200 mV to 1000 V; AC 200 mV to 700 V (RMS)
• Current: DC and AC 500 µA to 20 A (RMS)
• Resistance: 2-wire and 4-wire (Kelvin) modes; 200 Ω to 20 GΩ
• Temperature: Thermocouple (J, K, T, E, R, S, B, N) and RTD inputs
• Frequency: 10 Hz to 1 MHz
• Capacitance: 1 nF to 10 µF
• Diode testing with forward voltage and reverse breakdown measurement
SourceMeter Output
• DC Voltage: 0 V to ±200 V at 10 µV resolution
• DC Current: 0 A to ±20 A at 10 nA resolution
• Sourcing modes: Constant voltage (CV) and constant current (CC)
• Sweep capabilities for voltage and current characterization
Switching Architecture
• High-density modular chassis with configurable slots
• General-purpose relay modules for low-level to high-power signals
• Multiplexer modules for multi-input to single-output routing
• Matrix modules for cross-point switching and flexible source-to-destination connections
• RF/coaxial switch modules for high-frequency signal routing
• High-density terminal block configurations
– Key Features
• Integrated DMM eliminates external measurement instruments
• Modular design accommodates diverse test configurations
• Low contact resistance and minimal thermal EMF for signal integrity
• Three-port connectivity: GPIB, Ethernet, USB
– Typical Applications
• Automated component characterization
• Circuit verification in production test
• Multi-channel device validation
• High-frequency signal routing and measurement
– Compatibility & Integration
GPIB, Ethernet, and USB interfaces support integration into existing test infrastructure and ATE systems.
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