Keithley 617 Programmable Electrometer

The Keithley 617 Programmable Electrometer is a precision instrument for measuring extremely low currents, high resistances, voltages, and charges in advanced scientific and engineering applications. Its femtoampere-level sensitivity, input bias current below 5 fA, and input impedance exceeding 200 GΩ ensure non-invasive measurement of high-impedance circuits. Full programmability via IEEE-488 interface enables automated test sequences and data acquisition across four measurement modes.

– Technical Specifications

Measurement Ranges:
• Voltage: 10 µV to 200 V
• Current: 0.1 fA to 20 mA
• Resistance: 0.1 Ω to 200 GΩ (extended to 10¹⁶ Ω with internal voltage source)
• Charge: 10 fC to 20 nC

Display & Readout:
• 4.5-digit numeric LED with two-digit alphanumeric exponent
• Overrange indication (“OL”)

Measurement Performance:
• Input bias current: <5 fA at 23°C
• Input voltage burden: 95 dB at pA range; 60 dB at nA, pA, mA ranges (50/60 Hz ±0.1%)
• Gain error: Typically 5 ppm
• Small-signal bandwidth: -3 dB at 100 kHz
• Preamp settling: 2.5 s (pA range), 15 ms (nA range), 5 ms (µA/mA ranges)
• Conversion time: 330 ms
• Warm-up to rated accuracy: 1 hour

Integrated Voltage Source:
• Output range: -102 V to +102 V
• Programmable steps: 50 mV
• Maximum output current: ±2 mA with active current limit <4 mA
• Settling time: <3 ms to rated accuracy
• Noise: <(1 ppm of output + 200 µV) p-p (0.1 Hz to 10 Hz)
• Accuracy (1 year, 18–28°C): ±(0.2% + 50 mV)

– Key Features

• Dual resistance measurement methods: constant current and constant voltage
• IEEE-488 programmable interface with full command set support
• Multiline commands: DCL, LLO, SDC, GET, GTL, UNT, UNL, SPE, SPD
• 100-reading storage and retrieval capability
• Zero Correct and Zero Suppress functions
• Digital calibration and engineering units selection

– Electrical & Environmental

• Power: 105–125 V or 210–250 V (internal switch), 50–60 Hz, 25 VA

– Compatibility & Integration

IEEE-488 interface enables integration into automated test systems. All measurement and source functions are remotely programmable, supporting trigger-based and sequential measurement protocols.