Keithley Instruments 2420 60V/3A 60W High Current Sourcemeter

The Keithley 2420 is a 60W SourceMeter integrating voltage source, current source, voltage meter, current meter, and ohmmeter into a single instrument. It delivers ±5µV to ±60V sourcing, ±1µV to ±60V measurement, and ±100pA to ±3A current range with 0.012% basic accuracy and 6½-digit resolution. Built for 4-quadrant operation, it sources and sinks across semiconductor, automotive, and medical device characterization and production test environments.

– Technical Specifications

• Power Output: 60W
• Voltage Source: ±5µV to ±60V
• Voltage Measurement: ±1µV to ±60V
• Current Range (Source & Measure): ±100pA to ±3A
• Measurement Accuracy: 0.012% basic
• Resolution: 6½-digit
• Reading Speed: Up to 1700 readings/s at 4½ digits via GPIB
• Memory Buffer: 5,000 readings @ 5½ digits (dual 2,500-point buffers with timestamps)
• Source Memory List: Up to 100 points (fixed DC, Memory List, Stair modes)
• Test Sequence Storage: Up to 100 configurations with source/measurement settings and pass/fail criteria
• Resistance Measurement: 2-, 4-, and 6-wire remote sensing with guarding

– Key Features

• 4-Quadrant Operation: Source and sink capability across full voltage and current ranges
• Built-in Comparator: Fast pass/fail testing for binning and sorting
• Contact Check Function: Verifies test connections in ~350µs
• Programmable Compliance: Current source and voltage clamp limits for fault protection
• Digital I/O Port: Programmable automation interface with 5V, 300mA supply for handler and prober control
• Trigger Link Interface: High-speed instrument synchronization
• Math Functions: User-definable calculations for derived parameters
• Guarding Capability: Isolates components under test in complex networks

– Interfaces & Integration

• Standard: GPIB (SCPI-1995.0), RS-232
• Optional: Keithley Trigger Link
• Drivers: TestPoint, LabVIEW

– Typical Applications

Semiconductor characterization, automotive device testing, medical device validation, component binning and sorting, and production test scenarios requiring tightly coupled sourcing and measurement.