Keithley System 40

The Keithley System 40 is a modular test and measurement platform engineered for automated testing and high-volume data acquisition. Its plug-in card architecture enables rapid configuration for diverse switching, multiplexing, and signal routing applications across temperature measurement, device power control, and RF/microwave environments. The system supports relay-based switching with onboard memory storage, two- or four-wire measurement capability, and isolated switching options with exceptionally low contact potential.

– Technical Specifications

Multiplexer Module (7702/7702-AU):
• 40-channel differential switching: 2-pole or 20-channel 4-pole configuration
• Two independent multiplexer banks supported
• Two protected current measurement channels
• Voltage channels: 300 V, 1 A (60 W, 125 VA)
• Current channels: 3 A capacity
• Two- or four-wire measurement modes
• Screw terminal connections

Scanner Card (7705):
• 40-channel independent switching, 1-pole Form A
• 300 V, 2 A capacity
• 50-pin female D-sub connectors
• Relay closures stored in onboard memory

Isolated Switch Card (7036):
• 40-channel independent 1-pole Form A switching
• 1 A switch rating
• <100 pA offset current
• <4 µV contact potential
• 96-pin mass terminated connector

RF/Microwave Routing (40-C203 with F Module):
• Modular RF/microwave signal routing capability
• Customer-configurable architecture

– Key Features

• Modular plug-in card design for flexible system expansion
• Relay closure memory for sequence automation
• Ultra-low leakage current and contact potential in isolated switching paths
• Multiple connector options: screw terminals, D-sub, and mass-terminated interfaces

– Typical Applications

• Temperature measurement systems (RTD, thermistor, thermocouple)
• Automated device power and load switching
• RF/microwave signal path selection
• Portable device test automation
• High-channel-count data acquisition

– Compatibility & Integration

The System 40 accommodates diverse measurement modules within a single chassis, supporting parallel operation of multiplexing, scanning, and switching functions. Relay memory storage enables programmed test sequences without external sequencing logic.