Kepco ATE15-50DM

The Kepco ATE15-50DM is a precision linear programmable DC power supply delivering 1000 W across a 0–15 VDC and 0–50 ADC range. Built for laboratory, research, and industrial test environments, this full-rack unit combines analog control stability with digital metering for accurate real-time output monitoring. Automatic crossover between voltage and current modes, coupled with selectable Slow and Fast operating modes, enables both steady-state regulation and dynamic response. Low-noise fan cooling and CE marking per LVD, EN61010-1, and EMC Directives ensure quiet, compliant operation in demanding test setups.

## Technical Specifications

**Output Performance**
• Voltage Range: 0–15 VDC; Current Range: 0–50 ADC
• Power Output: 1000 W
• Ripple & Noise (Slow Mode): <0.1 mV RMS, <1 mV peak-to-peak
• Ripple & Noise (Fast Mode): <0.3 mV RMS, <3 mV peak-to-peak
• Load Regulation (Voltage Mode): 2 mA typical, 5 mA max.
• Load Regulation (Current Mode): 0.01% Io max. (Slow), 0.03% Io max. (Fast)
• Drift (8-hour): <0.005% Eo, <0.01% Io
• Output Impedance (Voltage Mode): Rs = 6 mΩ, Ls = 0.5 µH
• Output Impedance (Current Mode): Rp = 30 kΩ, Cs = 5 µH

## Key Features

• Panel-mounted 10-turn rheostats for high-resolution local voltage and current control
• Fully programmable via 0–10 V analog signal with two uncommitted amplifiers for signal conditioning
• Programmable overvoltage crowbar protection, adjustable manually or via 0–10 V signal
• Remote error sensing terminals for external feedback integration
• Optically isolated TTL-compatible flag signal output
• Selectable Slow Mode (constant voltage applications) and Fast Mode (dynamic load transients)

## Typical Applications

• Device characterization and component testing in R&D environments
• Automated test equipment (ATE) requiring stable, programmable supplies
• Transient response and load regulation validation
• Precision analog circuit development and validation

## Compatibility & Integration

Designed for integration into test racks and automated systems via analog programming signals and optically isolated control lines. Dual uncommitted amplifiers enable custom signal scaling and summing for multi-channel test configurations.