The Keysight 33521B is a single-channel, 30 MHz waveform generator delivering high-fidelity signal generation through Trueform technology. This benchtop instrument generates standard waveforms, arbitrary signals, and modulated outputs with harmonic distortion and jitter performance. The 250 MSa/s sampling rate and 16-bit resolution enable precise, repeatable signal creation for design validation, circuit characterization, and research applications.
– Technical Specifications
• Bandwidth: 30 MHz
• Channels: 1
• Sampling Rate: 250 MSa/s
• Resolution: 16-bit
• Amplitude Range: 1 mVpp to 10 Vpp
• Waveform Memory: 1 MSa/channel standard; 16 MSa/channel with Option MEM
• Rise/Fall Time: 8.4 ns
• Harmonic Distortion: 5× lower than DDS technology (sine waves)
• Jitter Performance: 10× lower than DDS for pulses up to 30 MHz
– Key Features
Standard Waveforms: Sine, square, ramp, pulse, triangle, Gaussian noise, PRBS, and DC. Seventeen built-in waveforms included.
Arbitrary Waveform Generation: Point-by-point creation with multi-segment sequencing. Non-aliasing technology maintains accuracy across all rates. Built-in ARB waveforms include cardiac, exponential fall/rise, Gaussian pulse, haversine, Lorentz, D-Lorentz, negative ramp, and sinc.
Modulation Capabilities: AM, FM, PM, FSK, BPSK, PWM, and sum (carrier + modulation). Modulation frequency up to the carrier frequency.
Signal Combining: Dual-tone multifrequency generation without dual-channel hardware. On two-channel models, sum and combine up to four signals.
Noise Generation: Variable bandwidth noise control for frequency content shaping.
– Interfaces & Control
• LAN (LXI-C), USB, GPIB
• Built-in web browser for remote LAN operation
• Front-panel USB thumb drive port
• Large color graphical display for parameter setup and waveform viewing
• BenchVue-enabled for PC-based control and automated test development
• Optional 33503A BenchLink Waveform Builder Pro for advanced waveform design
– Typical Applications
Electronic design validation, analog and mixed-signal circuit testing, educational research, prototype characterization, and signal integrity studies.
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