Keysight (Agilent) 3577B Network Analyzer, 5 Hz – 200 MHz

The Keysight (Agilent) 3577B is a precision network analyzer engineered for frequency response characterization across 5 Hz to 200 MHz. It measures magnitude, phase, insertion loss, group delay, SWR, electrical length, gain compression, return loss, reflection coefficient, and impedance with accuracy. The instrument delivers ±0.02 dB magnitude accuracy and ±0.2° phase accuracy, supported by a 100 dB+ dynamic range and –130 dBm noise floor. Its built-in three-term error correction and twenty-segment limit test capability enable rigorous validation of RF and low-frequency networks.

The 3577B configures as a two-channel or optionally three-channel system, scaling from basic transmission measurements to full S-parameter analysis when paired with the 35677A/B S-parameter test set. The 35676A/B reflection/transmission kit extends reflection measurements. Selectable 50 Ω or 1 MΩ input impedance accommodates diverse test configurations. DC bias inputs (±30 V, ±20 mA typical) support active device characterization.

– Technical Specifications

Frequency Range: 5 Hz to 200 MHz

Source Output: +15 dBm to –49 dBm, 0.1 dB resolution

Measurement Resolution: 0.001 dB magnitude; 0.005° phase; 1 ps group delay

Accuracy (Dynamic Range): ±0.02 dB magnitude; ±0.2° phase

Resolution Bandwidths: 1 Hz, 10 Hz, 100 Hz, 1 kHz (selectable)

Input Impedance: 50 Ω (>25 dB return loss) or 1 MΩ || ~30 pF

Connectors: Type N female, 50 Ω; BNC female DC bias (rear panel)

Sensitivity: –110 dBm (50 Ω, 10 Hz RBW, 30 kHz–200 MHz)

Crosstalk Isolation: >100 dB between inputs

DC Bias: ±30 V, ±20 mA typical; 200 mA damage rating

– Key Features

• Discrete sweep mode reduces sweep time by factor of twenty versus linear sweep
• Continuous, single, and manual sweep modes with free run, immediate, line, and external trigger
• Four selectable resolution bandwidths optimize signal-to-noise and measurement speed
• Three-term error correction plus normalization for traceable measurements
• Twenty-segment limit testing per trace
• 0.001 Hz source frequency resolution

– Typical Applications

• Network and filter characterization (5 Hz–200 MHz)
• Return loss and reflection coefficient measurement
• Impedance analysis and electrical length determination
• Gain compression testing
• Group delay measurement
• SWR validation

– Compatibility & Integration

Full internal programmability via HP Instrument BASIC and external control via HP-IB enable custom measurement routines and system automation.