The Keysight (Agilent) 6911A is a 68-channel logic analysis module engineered for high-speed digital system debugging and validation. It delivers simultaneous timing and state analysis across all channels, enabling rapid isolation of signal integrity issues in complex designs. This modular instrument integrates into Keysight 16900 Series mainframes, allowing scalable configurations up to 340 total channels by combining up to 5 modules.
– Technical Specifications
Timing Analysis (Asynchronous Sampling)
• Timing Zoom: 4 GHz with 250 ps resolution and 64 K memory depth
• Conventional Timing: 1.0 GHz (half-channel) or 500 MHz (full-channel) with deep memory
• Transitional Timing: 500 MHz
State Analysis (Synchronous Sampling)
• State Clock Rates: Up to 450 MHz
• Data Rates: Up to 500 Mb/s
• Eye Diagrams: Simultaneous capture on all 68 channels
• Automated threshold and sample position setup for high-speed buses
Channel and Memory Configuration
• 68 channels per module
• Selectable memory depths: 1 M, 4 M, 16 M, and 32 M
• Maximum 340 channels with five-module configuration
Signal Characteristics
• Single-ended signal support
• Adjustable threshold range: -5 V to +5 V in 10 mV increments
– Key Features
• Real-time eye diagram generation identifies timing violations and signal degradation across all channels simultaneously
• Deep memory options (up to 32 M) capture extended transaction sequences
• Fine-grained threshold control (10 mV resolution) ensures accurate sampling on mixed-voltage designs
• Dual-mode analysis: switch between timing zoom for high-frequency transients and state mode for synchronous protocol capture
– Typical Applications
• Multi-protocol serial bus debugging (PCIe, DDR, Ethernet)
• FPGA and ASIC validation
• System-on-Chip (SoC) signal integrity analysis
• High-speed digital interface characterization
– Compatibility & Integration
The 6911A operates within Keysight 16900 Series modular logic analyzer mainframes. It accepts standard 40-pin logic analyzer probes (ordered separately) and supports mixed-module configurations for applications requiring both high-channel-count and specialized measurement capabilities.


















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