Keysight (Agilent) 70843C 12.5 Gb/s MMS Base Unit

The Keysight (Agilent) 70843C is a high-speed error performance analyzer, pattern generator, and error detector engineered for digital communication and semiconductor testing. Operating across 0.1 Gb/s to 12.5 Gb/s, this modular measurement system delivers precise bit error ratio analysis with support for PRBS patterns from 2⁷-1 to 2³¹-1. The base unit integrates into the 71612C measurement and analysis platform, providing synchronized clock and data generation with multiple output configurations.

– Technical Specifications

• Bit Rate: 0.1 Gb/s to 12.5 Gb/s
• Supported Patterns: PRBS 2⁷-1 to 2³¹-1
• Data and Clock Output Amplitude: 0.5 V to 2 V peak-to-peak
• High Level (Data and Clock Outputs): +1.5 V to −3.5 V
• Transition Time: Less than 30 ps
• Jitter (Data and Clock Outputs): Less than 20 ps peak-to-peak
• Interface Impedance: 50 ohms
• Error Detector Sensitivity: <200 mV peak-to-peak (typical at 10 Gb/s)
• Decision Threshold Range: +1 V to −3 V in 1 mV steps
• Phase Alignment: ±1 ns (100 MHz to 500 MHz); 1 clock period (500 MHz to 12 GHz)
• Phase Resolution: 1 ps
• Error Detector Frequency Range: 100 MHz to 12 GHz
• Error Output: 0 to −0.4 V nominal
• Measurement Modes: Manual, single period, repetitive period
• Measurement Period: 1 s to 100 days; 10, 100, 1000 errors; 10⁷ to 10¹⁵ bits
• Pattern Synchronization: Automatic or manual
• Selectable Threshold: 10⁻¹ to 10⁻⁸

– Key Features

• Dual data and inverted data outputs with dedicated clock and inverted clock outputs
• Quarter-rate clock with four dedicated quarter-rate data outputs
• External clock input for synchronization applications
• External error inject and alternate-pattern switch inputs
• Data output on/off control via switch input
• Pattern or clock/8 trigger output selection
• Audible output proportional to error ratio
• Time-stamped result logging to external printer
• Remote operation via HP-IB

– Typical Applications

• Bit error ratio measurement and analysis
• High-speed digital communication system validation
• Semiconductor device characterization
• Pattern generation and error detection

– Compatibility & Integration

The 70843C operates as a core component within the 71612C Bit Error Ratio measurement and analysis system and supports rackmount integration in the MMS System II cabinet.