Keysight (Agilent) 81150A Pulse Function Arbitrary Noise Generator

The Keysight (Agilent) 81150A Pulse Function Arbitrary Noise Generator is a dual-channel signal source combining pulse, function, arbitrary waveform, and noise generation in a single instrument. It delivers precise test signals across frequencies from 1 µHz to 240 MHz, with deterministic white Gaussian noise featuring selectable crest factor and modulation capabilities up to 50 MHz. The instrument generates standard waveforms—pulse, sine, square, ramp, noise—plus predefined arbitrary waveforms including exponential rise/fall, sin(x)/x, cardiac, and DC profiles. Two independent or synchronized channels support AM, FM, PM, PWM, and FSK modulation from internal or external sources. Arbitrary waveform generation operates at 14-bit resolution with 2 GSa/s sample rate and 512 k samples per channel memory. Output impedance selects between 50 Ω and 5 Ω with differential output support. Amplitude ranges from 50 mVpp to 20 Vpp depending on load impedance and amplifier configuration. Pulse transition times span 2.5 ns to 1000 s (10% to 90%) with 100 ps width resolution. Noise generation supports arbitrary distributions and triggering with signal repetition times up to 26 days, eliminating repetitive test patterns. Optional pattern generator enables analog, digital, and mixed-signal device testing. The integrated two-channel architecture reduces cabling, minimizes footprint, and accelerates test cycles.

– Technical Specifications

• Pulse generation: 1 µHz to 120 MHz with variable rise/fall times
• Sine output: 1 µHz to 240 MHz
• Arbitrary waveforms: 14-bit, 2 GSa/s, 512 k samples per channel
• Modulation types: AM, FM, PM, PWM, FSK (up to 50 MHz)
• Output channels: 2 (independent, synchronized, coupled, or added)
• Output impedance: 50 Ω or 5 Ω selectable
• Amplitude: 50 mVpp to 5 Vpp standard; up to 20 Vpp with high voltage amplifier
• Pulse rise/fall times: 2.5 ns to 1000 s (10% to 90%)
• Pulse width resolution: 100 ps
• Noise: Deterministic white Gaussian with arbitrary distributions; repetition time to 26 days
• Differential outputs supported

– Key Features

• Dual independent generators or synchronized coupled operation
• Internal and external modulation sources
• Glitch-free parameter changes
• Predefined waveforms: exponential rise/fall, sin(x)/x, cardiac, DC
• Optional pattern generator for mixed-signal testing

– Typical Applications

• Device stress testing to component limits
• Analog, digital, and mixed-signal device validation
• Deterministic noise characterization
• Modulation and signal integrity testing

– Compatibility & Integration

Two-channel architecture enables time-synchronized operation, reduces external cabling, and consolidates measurement resources.