The Keysight B2901B is a single-channel, benchtop Precision Source Measure Unit delivering integrated sourcing and measurement capabilities for demanding characterization tasks. This four-quadrant SMU sources and measures voltage and current with exceptional resolution—down to 100 fA and 100 nV—enabling efficient I-V characterization of semiconductors, active/passive components, and electronic devices without external setup complexity.
– Technical Specifications
Sourcing and Measurement Performance
• Channels: 1
• Source Resolution: 1 pA / 1 µV minimum
• Measurement Resolution: 100 fA / 100 nV minimum
• Voltage Range (Source): ±200 mV to ±210 V
• Voltage Range (Measurement): ±210 V
• DC Current Range (Source): ±100 nA to ±10.5 A
• DC Current Range (Measurement): ±3 A
• Pulsed Current: 10.5 A maximum
• Output Power: 31.8 W
• Accuracy: 0.015%
• Resistance Measurement: 2 Ω to 200 MΩ (eight ranges)
Waveform and Sampling Capabilities
• Arbitrary waveform generation and digitizing from 20 µs interval
• Digitizing Interval: 10 µs or 20 µs minimum
• Sampling Rate: 50,000 Sa/s or 100 k Sa/s
• Fast sweep measurement and list sweep function
– Key Features
• Four-quadrant sourcing and measurement operation
• 4.3-inch color TFT display with graphical and numerical modes
• Innovative GUI enabling I-V measurement without PC programming
• Programming memory reduces repeated test command execution time
• USB 2.0, LAN, and GPIB connectivity with digital I/O interfaces
• SCPI command set compatibility with conventional and default protocols
– Typical Applications
• Semiconductor characterization and test
• Active and passive component evaluation
• General electronics testing and validation
– Compatibility & Integration
PC-based control via included application software supports remote measurement without programming. BenchVue, Quick I/V Software, and EasyEXPERT group+ facilitate flexible test automation. PathWave IV Curve Measurement Software integration enables advanced characterization workflows.
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