Keysight / Agilent / HP E8312A 330 MHz Pulse Pattern Generator

The Keysight E8312A is a VXI C-size pulse pattern generator delivering dual-channel digital pattern generation up to 330 MHz. This register-based, 1-slot module generates precise, synchronized pulse patterns with 16 Kbit depth per channel and selectable transition times of 0.8 ns or 1.6 ns. Output reaches 3.8 V into 50 Ohms with 5 ps timing resolution. The instrument supports multiple trigger modes—continuous, external (triggered, gated, width), internal, and manual—and interfaces via SMA connectors with access to 8 TTL and 2 ECL VXI backplane trigger lines. A user-defined strobe output carrying 16 Kbit NRZ patterns enables complex test sequence control.

– Technical Specifications

• Maximum Frequency: 330 MHz
• Output Amplitude: Up to 3.8 V into 50 Ohms
• Output Impedance: 50 Ohms
• Pattern Depth: 16 Kbit per channel
• Transition Times: 0.8 ns or 1.6 ns (selectable)
• Timing Resolution: 5 ps (best case)
• Period Range: 3.03 ns to 999.5 s
• Pulse Width Range: 1.515 ns to (period − 3.03 ns)
• Double Pulse Delay Range: (width + 3.03 ns) to (period − width − 3.03 ns)
• External Input Sensitivity: ≤300 mVp-p typical
• Output Connectors: SMA (f) 3.5 mm, differential
• Cooling Requirement: 2.8 liters/second
• Net Weight: 1.6 kg

– Key Features

• Dual-channel architecture with independent pattern control
• Trigger modes: continuous, external (triggered/gated/width), internal, manual
• Supports TTL, CMOS, ECL, PECL, LVDS, and GTL logic families
• External clock/reference input with internal PLL for frequency accuracy
• Strobe output for burst and pattern mode synchronization

– Typical Applications

• High-speed digital and mixed-signal device testing
• Clock generation for test system synchronization
• Radar testing and serial bus validation
• Flash memory pattern generation

– Compatibility & Integration

Functionally compatible with the Keysight 81110A, enabling seamless migration of test routines from laboratory to production environments. VXIplug&play software drivers support direct integration into VXI test systems.