Keysight (Agilent) M9111A PXIe High-Speed Source/Measure Unit

The Keysight M9111A is a PXIe High-Speed Source/Measure Unit (SMU) engineered for precision sourcing and measurement in automated test systems. This 1-slot, 3U module delivers dual independent channels with 2-quadrant capability, enabling fast voltage and current measurements across semiconductors, power management circuits, and component characterization. The M9111A combines high-speed sourcing with sub-millisecond measurement settling and output voltage stabilization.

– Technical Specifications

Physical & Architecture
• Form factor: PXIe module, 1-slot, 3U
• Dimensions: 19.9 mm W × 128.4 mm H × 212.6 mm D
• Channels: 2 independent
• Quadrants: 2-quadrant operation

Output Ratings
• Option 1: 13 V, ±1 A, 13 W
• Option 2: 6 V, ±3 A, 18 W
• Maximum output voltage: 13 V
• Maximum current per output: 3 A
• Maximum output power: 18 W
• Maximum terminal voltage: 60 VDC from chassis ground

Measurement Ranges & Resolution
• Voltage range: −42 V to +42 V
• Current range: 100 pA to 2 A
• Voltage measurement resolution: 120 µV
• Current measurement resolution: 1.4 nA
• Compliance voltage: −42 V to +42 V

Measurement Accuracy
• Voltage accuracy: 0.05% + 1 mV
• Current accuracy (3 A range): 0.05% + 300 µA
• Current accuracy (1 mA range): 0.05% + 100 nA
• Current accuracy (100 µA range): 0.05% + 10 nA

Performance
• Digitize voltage and current: ~200k samples/s
• Output voltage settling: Less than 1 ms (measure and stabilize)
• Voltage change speed: 10–50 microseconds
• Bandwidth: DC to 3 MHz
• Load lead drop tolerance: Up to 1 V per lead

– Key Features

• Fast transient response with low voltage droop under dynamic pulse loading
• High-speed measurement of low currents down to µA with capacitive loads to 150 µF
• output stability under extreme load conditions
• IVI-COM programmability for seamless system integration

– Typical Applications

• Semiconductor device characterization
• Power management IC testing
• Component parametric measurement
• Fast pulse and transient testing

– Compatibility & Integration

• PXIe architecture enables multi-module test systems
• IVI-COM programming interface