The Keysight N6974A Advanced Power System is a 2000 W DC power supply engineered for automated test equipment (ATE) applications requiring high-speed, precision power delivery. Operating from 0 to 80 V at 0 to 25 A, this single-output instrument leverages VersaPower architecture to achieve command processing in less than 2 ms and transient settling in 100 µs—enabling test speeds up to 100x faster than conventional supplies. The N6974A combines programmable source control with DMM-grade measurement accuracy, supporting 18-bit voltage and current measurement resolution alongside power, peak power, watt hour, and amp hour calculations.
– Technical Specifications
• Power Rating: 2000 W
• Output Voltage: 0 to 80 V DC
• Output Current: 0 to 25 A
• Voltage/Current Programming Resolution: 14 bits
• Measurement Resolution: 18 bits (voltage and current)
• Command Processing Speed: Less than 2 ms
• Up/Down Programming Time: As fast as 3 ms; 500 µs with Option 303
• Transient Settling Time: 100 µs
• Input Voltage: 240 VAC
• Rack Space: 2U (426.9 mm W × 88.1 mm H × 633.2 mm D)
• Weight: 15.5 kg
– Key Features
• Up to 100x faster test throughput versus standard power supplies
• Adjustable measurement rates balancing speed and accuracy
• Two-quadrant operation: 10% bidirectional capability standard; full 100% with optional N7909A dissipater unit (1 kW per unit)
• Arbitrary waveforms with constant-dwell support (Option 303)
• Output list capability for complex test sequences (Option 303)
• Programmable rise time and external data logging (Option 302)
• Voltage and current digitizers with programmable sample rates (Option 302)
• Option 301 adds second seamless current measurement range and enhanced accuracy
– Typical Applications
Device characterization, power conversion testing, battery emulation, regenerative energy system validation, and high-throughput production ATE requiring fast transient response and precise power control.
– Compatibility & Integration
GPIB (IEEE-488), LAN (LXI-Core), and USB interfaces enable integration into multi-instrument test systems.



























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