Kikusui PAD110-20L

The Kikusui PAD110-20L is a variable regulated DC power supply engineered for laboratory testing, production line verification, and extended aging applications. This Type III unit delivers 0–110 V at 0–20 A with automatic CV/CC crossover, utilizing a switching regulator and phase-control preregulator architecture to minimize output noise and maintain exceptional stability across transient load changes.

## Technical Specifications

**Output Ratings**
• Voltage (CV): 0 to 110 V
• Current (CC): 0 to 20 A
• Input: 200 ± 10% VAC, 3.8 kVA

**Output Quality**
• Ripple (CV): 1 mVrms
• Ripple (CC): 4 mArms
• Line Regulation (CV): ±0.005% + 1 mV
• Load Regulation (CV): ±0.005% + 2 mV
• Line Regulation (CC): 1 mA
• Load Regulation (CC): 3 mA
• Voltage Temperature Coefficient: 50 ppm/°C typical
• Transient Response Time: 50 µs (output recovers within 0.05% + 10 mV when current shifts 5% to 100%)

**Metering**
• Voltmeter: 4-digit display; ±(0.5% reading + 5 digits) error at 23°C ±5°C
• Ammeter: 4-digit display; ±(1% reading + 5 digits) error at 23°C ±5°C

**Protection**
• Overvoltage Protection: adjustable 10–110% of rated output
• Overcurrent Protection: adjustable 10–110% of rated output
• Overheat Protection and Input/Output Fuse included
• Optional high-speed thyristor crowbar overvoltage protector available

**Environmental**
• Operating Temperature: 0 to 40°C
• Operating Humidity: 10 to 90% RH
• Forced air cooling via integral fan
• Weight: exceeds 20 kg; two or more personnel required for relocation

## Key Features

• Fine 10-turn potentiometer control for voltage and current adjustment
• Remote voltage and current control via external voltage or resistance input
• Sensing function compensates for load wiring voltage drop
• Output ON/OFF control
• Large digital display for real-time monitoring

## Interfaces & Integration

Optional communication interfaces: RS232C, GPIB, USB

## Typical Applications

• Laboratory experimentation and characterization
• Production line functional and stress testing
• Long-term device aging and burn-in procedures