The Nanometrics/Accent Optical Technologies DiVA D265EP is a Dynamic I(V) Analyzer designed for advanced semiconductor device characterization through dynamic current-voltage measurements. This instrument delivers pulsed I-V analysis with pulse widths down to 200 nanoseconds, enabling measurement from a quiescent bias point while mitigating self-heating and charge trapping effects critical to RF and high-frequency device behavior. Unlike static I-V approaches, the DiVA D265EP captures transient response and real-world operational conditions essential for accurate device modeling.
– Technical Specifications
Measurement Capability
• Dynamic and DC I-V analysis with dual-channel synchronous pulse source measurement unit
• Pulse widths: down to 200 nanoseconds
• Transient measurements supported
• Drain/Collector channel: +65V output, 2A maximum current
• Gate/Base port: positive and negative current or voltage drive
Device Support
• FETs, HEMTs, NPN bipolar/HBT, diodes, and PNP bipolar transistors (variant dependent)
Data Acquisition & Analysis
• Iso-thermal and iso-dynamic data capabilities
• I(V) parameter fitting for HEMT and FET models
• Common data format support
• Controlled compliance
Control & Interface
• Third-party program control and batch mode operation
• Windows® interface
• Compact single-box form factor, approximately 50 lbs
– Key Features
• Mitigates self-heating and stored charge effects during pulsed measurements
• Simultaneous dual-channel sourcing and measurement
• Flexible gate/base characterization with bi-directional drive
• Stable measurement environment for precision characterization
– Typical Applications
• RF and high-frequency device development
• Advanced semiconductor research and development
• Device modeling for circuits sensitive to thermal and trapping phenomena
– Compatibility & Integration
The instrument integrates with third-party software through programmable control interfaces and operates in both manual and batch automation modes. Windows®-based software provides intuitive measurement setup and data analysis workflows.
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