Newport / ILX Lightwave LDT-5948 60W Precision Temperature Controller

The Newport / ILX Lightwave LDT-5948 is a 60 W precision temperature controller engineered for thermal management of laser diodes and optoelectronic components in laboratory and production environments. It delivers ±0.005°C setpoint accuracy and ±0.005°C stability over 24 hours through a fully programmable PID control loop with auto-tune functionality. The instrument accepts thermistor, IC sensor, and platinum RTD inputs across temperature ranges from −50°C to +250°C (general mode), with 0.001°C setpoint resolution and four-wire measurement capability. Output is provided via a bi-directional current source rated 5 A @ 12 V DC, with TEC current range −5.00 to +5.00 A and noise under 15 mA. Front-panel controls and GPIB/RS-232 interfaces enable both manual operation and automated test sequences. The compact 7.00 × 4.00 × 7.00 inch form factor (11 lbs) integrates readily into optical and laser-based test systems.

– Technical Specifications

• Output power: 60 W (5 A @ 12 V DC)
• TE current range: −5.00 to +5.00 A
• TE voltage range: −12 to +12 V
• Temperature control range: −50°C to +250°C (general); −50°C to +150°C (IC); −50°C to +199.999°C (RTD)
• Setpoint resolution: 0.001°C
• Setpoint accuracy: ±0.005°C
• 24-hour stability: ±0.005°C
• TEC ripple/noise: <15 mA
• Current limit: ±0.050 A (±5 A range)
• Resistance measurement: 10 µA mode (10 to 600 kΩ); 100 µA mode (1 to 60 kΩ)

– Key Features

• Fully programmable PID control with auto-tune
• Multi-sensor support: thermistor, IC, RTD
• Four-wire voltage and sensor measurements
• AC resistance measurement mode
• Bi-directional current source output
• DB25 female connector

– Typical Applications

• Laser diode internal TE control
• Wavelength and optical power stabilization
• Temperature-dependent optical component characterization
• Production test automation

– Compatibility & Integration

Works with LDC-3724B laser controller and LDM-4984 butterfly mount assemblies. GPIB and RS-232 interfaces support system integration and test automation via input/output triggers.