NI PXIe-5644 / PXIe-5644R PXI Vector Signal Transceiver

The NI PXIe-5644/5644R is a PXI Vector Signal Transceiver that integrates signal generation, signal analysis, and high-speed digital I/O into a single module for RF and wireless device testing. It operates from 20 MHz to 6 GHz with up to 70 MHz analysis and generation bandwidth, supporting analog and digital modulations including AM, FM, PM, ASK, FSK, PSK, and QAM variants. The transceiver delivers maximum output power of +17 dBm with a generation dynamic range of 85 dB and analysis sensitivity to -170 dBm typical. Built-in digital demodulation, spectrum analysis, EVM measurement, ACLR analysis, and I/Q data capture enable comprehensive RF characterization. Phase noise at 1 GHz (10 kHz offset) measures -110 dBc/Hz typical, while spurious-free dynamic range reaches 82 dBc across 100 MHz to 3 GHz. Frequency accuracy is ±50 ppb typical and power accuracy ±0.5 dB typical. The integrated digital interface supports configurable high-speed I/O up to 1 Gbps with PXI trigger and reference clock synchronization for multi-instrument test systems.

– Technical Specifications

RF Performance
• Frequency range: 20 MHz to 6 GHz (generation and analysis)
• Bandwidth: Up to 70 MHz (generation and analysis)
• Generation output power: -170 dBm to +17 dBm typical
• Analysis sensitivity: -170 dBm typical
• Phase noise: -110 dBc/Hz at 1 GHz, 10 kHz offset (typical)
• Spurious-free dynamic range: 82 dBc, 100 MHz to 3 GHz (typical)
• Generation dynamic range: 85 dB, 100 MHz to 3 GHz (typical)
• Analysis dynamic range: 85 dB, 100 MHz to 3 GHz (typical)
• Generation ACLR: >40 dBc at +1 dBm output, 10 MHz bandwidth, 10 MHz offset (typical)
• Analysis ACLR: >45 dBc at -20 dBm input, 10 MHz bandwidth, 10 MHz offset (typical)
• Power accuracy: ±0.5 dB (typical)
• Frequency accuracy: ±50 ppb (typical)

Signal Generation
• Modulation support: AM, FM, PM, ASK, FSK, PSK, QAM (QPSK, 16-QAM, 64-QAM, 256-QAM), proprietary modulations
• Arbitrary waveform generation for user-defined complex signals
• Integrated digital pattern generator
• Advanced sequencing for complex test scenarios

Signal Analysis
• Digital demodulation across multiple modulation schemes
• Real-time spectrum analysis with configurable RBW and VBW
• Channel power and ACLR measurement
• Error vector magnitude (EVM) measurement
• I/Q data acquisition and recording

Digital Interface
• High-speed digital I/O: Up to 1 Gbps typical
• Configurable channel count based on chassis and slot configuration
• PXI trigger line synchronization
• Reference clock synchronization for multi-instrument systems

– Key Features

• Unified vector signal generation and analysis in single PXI module
• Wide frequency coverage with high dynamic range on both transmit and receive paths
• Low phase noise for demanding RF measurements
• Arbitrary waveform capabilities for custom signal development
• Real-time spectrum and modulation analysis
• Direct digital interface for end-to-end RF and digital component testing

– Typical Applications

• Wireless device receiver and transmitter validation
• RF component characterization and performance verification
• Digital modulation scheme testing and optimization
• Adjacent channel leakage power and spectral mask compliance testing
• Multi-instrument synchronized RF test systems

– Compatibility & Integration

• PXIe form factor for flexible chassis integration
• PXI trigger and reference clock infrastructure for system-level synchronization
• Supports complex test sequences across multiple instruments