Pickering 41-620-003 Function Generator Module

The Pickering 41-620-003 is a three-channel function generator module designed for PXI-based automated test systems. It delivers precision signal generation across DC to 10 MHz with 48-bit frequency resolution and supports sine, square, triangle, and arbitrary waveforms. Each channel integrates 256 k of onboard memory for custom waveform storage, making it ideal for component testing, sensor emulation, and swept frequency applications across automotive and aerospace domains.

– Technical Specifications

Signal Generation
• Frequency range: DC to 10 MHz (sine waves)
• Frequency resolution: 48-bit
• Frequency accuracy: ±10 ppm (internal source) or referenced to PXI backplane / external 10 MHz clock
• Waveform types: Sine, square, triangle, arbitrary
• Arbitrary waveform memory: 256 k per channel
• Waveform bandwidth: Limited by 15 MHz low-pass filter
• DC offset: Supported
• Signal level control: 0 to −40 dB
• Modulation: AC-coupled, 10 Hz to 20 kHz

Output Characteristics
• Output impedance: Adjustable (600 Ω load: 10 V peak; 50 Ω load: 6 V peak DC & signal)
• Channels: Three independent

Triggering & Synchronization
• PXI trigger functions supported
• Clock reference: 10 MHz PXI backplane or external standard

Physical & Environmental
• Form factor: PXI 3U single-slot
• Operating temperature: 0 °C to +55 °C
• Storage temperature: −20 °C to +75 °C
• Humidity: Up to 90% non-condensing
• Altitude (operating): 5000 m

– Key Features

• Direct Digital Synthesis (DDS) for variable output frequencies
• Swept mode operation for frequency and amplitude sweeps
• Arbitrary waveform generation with sensor waveform emulation capability
• Single modulation input controls amplitude of up to three output channels
• Backward compatible with 41-620A-003 module
• PXI trigger integration for synchronized multi-instrument testing

– Typical Applications

• Electronic component and circuit characterization
• Sensor signal emulation (automotive, aerospace)
• Frequency sweep testing
• Multi-channel signal generation in automated test environments

– Compatibility & Integration

Fully compatible with PXI-based test systems. Supports multiple programming environments including Pickering Interfaces Switch Path Man.