Repair and Service Evaluation – HP/Agilent 8515A, 8515B, 8516A, 8516B, 8517A, 8517B

The HP/Agilent 8515A, 8515B, 8516A, 8516B, 8517A, and 8517B are dual-port S-parameter test sets engineered for integration with HP/Agilent 8510 series network analyzers. These instruments enable full scattering parameter characterization across microwave and millimeter-wave frequencies, supporting active and passive device evaluation in demanding RF applications.

– Technical Specifications

Frequency coverage spans multiple bands across the product line. The 8515A operates from 45 MHz to 26.5 GHz. The 8516A extends range to 40 GHz. Both 8517A and 8517B reach 50 GHz, providing access to millimeter-wave measurement bands.

Test ports employ 50 Ω nominal impedance. Connector types vary: 8515A and 8516A use 3.5 mm connectors; 8517A and 8517B use 2.4 mm connectors. Both support external DC bias application to test port center conductors for active device characterization, with model-dependent maximum ratings (8517A: 40 Vdc, 500 mA maximum).

Attenuation control is implemented via step attenuators on both ports. The 8515A provides two 90 dB attenuators. The 8516A includes two 60 dB attenuators. The 8517A offers 0 to 90 dB in 10 dB steps, while the 8517B features two 60 dB attenuators.

Power handling specifications are model-dependent. The 8517A operates at +3 to −13 dBm nominal levels. The 8517B accommodates +2 to −29 dBm, with high source power options available (Option 004). Dynamic range enhancements are available for enhanced measurement confidence at upper frequency bands (Option 007 for 8517B; Option 003 for 8516A/8517A).

– Key Features

• Dual independent reference channels—one per incident port
• Internal electronic switching for port selection
• DC bias capability for active component testing
• Step attenuator control on both measurement ports
• Millimeter-wave operation to 50 GHz on select models

– Typical Applications

These test sets characterize S-parameters of passive components, amplifiers, filters, and switches across RF and microwave frequencies. Active device bias control enables transistor and MMIC evaluation under operating conditions.

– Compatibility & Integration

Designed for 8510 series network analyzer platforms. Multiple test sets can be configured within a single 8510C system for extended measurement capability.