The Rigol MSO1074Z-S is a 70 MHz mixed-signal oscilloscope combining four analog channels with 16 digital logic analyzer channels. Engineered for embedded systems debugging and signal analysis, it delivers 1 GSa/s real-time sampling, up to 30,000 waveforms/s capture rate, and deep memory up to 12 Mpts per channel (expandable to 24 Mpts). The 7-inch WVGA display with multi-level intensity grading enables detailed waveform observation across complex measurement scenarios.
– Technical Specifications
• Analog Channels: 4 at 70 MHz bandwidth (-3 dB)
• Digital Channels: 16 logic analyzer inputs
• Sample Rate: 1 GSa/s real-time
• Memory Depth: 12 Mpts/channel standard; optional 24 Mpts/channel
• Waveform Capture Rate: 30,000 wfms/s
• Vertical Resolution: 8-bit analog, 1-bit digital
• Vertical Scale: 1 mV/div to 10 V/div (1X probe ratio)
• Vertical Offset: ±2 V (1 mV to 499 mV/div); ±100 V (500 mV to 10 V/div)
• Input Impedance: Analog 1 MΩ ±1% || 15 pF ±3 pF; Digital 100 kΩ ±1% || 8 pF ±3 pF
• Maximum Input Voltage: Analog CAT I 300 Vrms, CAT II 100 Vrms, transient 1000 Vpk; Digital CAT I 40 Vrms, transient 800 Vpk
• Input Coupling: DC, AC, GND (analog)
• Probe Attenuation: 0.01X to 1000X (1-2-5 steps)
• Timebase: 5 ns/div to 50 s/div; ±25 ppm accuracy; ±5 ppm/year drift
• Display: 7-inch WVGA (800×480) TFT LCD
– Key Features
• UltraVision architecture with deep memory and high capture rates
• Bandwidth limit option at 20 MHz
• Low frequency response ≤5 Hz (AC coupling)
• YT, XY, and Roll timebase modes
• Serial bus triggering and decoding: RS232/UART (2400–921600 bps), I2C (7/8/10-bit addressing), SPI (4–32-bit data, 16 ns–10 s timeout)
• Advanced trigger types: Runt, Window, Nth Edge, Slope, Delay, Duration
• Delay range: negative to ±1/2 (memory/sample rate); positive 1 s to 500 s
– Typical Applications
Embedded system design, protocol analysis, multi-channel signal debugging, and complex timing measurements in laboratory and enterprise environments.
– Compatibility & Integration
Supports variable probe attenuation coefficients from 0.01X to 1000X for flexible measurement scaling across high and low-voltage domains.
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