The Rohde & Schwarz SMS Signal Generator with options B2, B3, and B4 delivers precise signal generation across a wide frequency spectrum for development, production, and service applications. This calibrated instrument generates signals from 100 kHz to 520 MHz (extended to 1040 MHz with Option B2), with output levels adjustable from +13 dBm to −137 dBm in 0.1 dB steps. Engineers and laboratories rely on its modulation versatility—AM to 95% depth, FM with up to 125 kHz deviation, phase modulation, FSK, and simultaneous AM/FM—coupled with exceptional signal purity and frequency stability.
– Technical Specifications
Frequency Coverage: 100 kHz to 520 MHz standard; 1040 MHz with Option B2. Readout resolution: 100 Hz (200 Hz above 520 MHz).
Output Power: +13 dBm to −137 dBm adjustable, 0.1 dB resolution. Level accuracy typically 0.8 dB. Switchable off via AF-OFF button.
Modulation Capability:
• AM: up to 95% modulation depth; internal 400 Hz or 1000 Hz generator or external signal
• FM: up to 125 kHz deviation; internal or external modulation with 50 Hz resolution
• Phase Modulation and FSK supported
• Simultaneous AM and FM operation
• External Level Control (ALC) available
Signal Quality:
• Spurious deviation (rms): 3 Hz (CCITT) or 15 Hz (30 Hz to 20 kHz)
• Harmonics and subharmonics: typically 20 dB down
• Signal-to-Noise Ratio: 120 dB at 20 kHz from carrier; 145 dB at 1 MHz from carrier
Frequency Stability (with Option B1):
• Temperature drift: < ±1 × 10⁻⁷ across full temperature range
• Crystal aging: < 5 × 10⁻⁸ per month
– Key Features
Compact, portable design with overvoltage protection. IEC-bus and HP-IB programmability enable 40 ms setting time. Modulation depth and frequency display with 3-digit readout. Dual modulation inputs—second input switchable to M or AM.
– Typical Applications
Component and system-level RF testing, receiver sensitivity measurement, modulation quality assessment, and signal integrity verification in development and manufacturing environments.
– Compatibility & Integration
IEC 625 Bus and HP-IB interfaces support automated test sequencing and remote instrument control.


















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