Stanford Research DS335 – Synthesized Function Generator

The Stanford Research Systems DS335 is a synthesized function generator built on Direct Digital Synthesis (DDS) architecture for precision signal generation across benchtop and automated test environments. It delivers sine, square, ramp, triangle, and Gaussian white noise waveforms with exceptional spectral purity and stability, making it suitable for electronics testing, research, and development applications requiring accurate waveform synthesis.

– Technical Specifications

Frequency and Waveform Generation
• Frequency range: 1 µHz to 3.1 MHz
• Frequency resolution: 1 µHz
• Sine output: up to 3.1 MHz with spurious response <-65 dBc (≤1 MHz) and <-55 dBc (1–3.1 MHz)
• Square wave: up to 3.1 MHz with rise/fall time <15 ns ± 5 ns (10%–90%)
• Ramp and triangle: up to 10 kHz with ±0.1% linearity
• Gaussian white noise: 3.5 MHz bandwidth
• Harmonic distortion: <-60 dBc (DC–100 kHz), <-50 dBc (100 kHz–1 MHz), <-40 dBc (1–3 MHz)
• Phase noise: <-60 dBc (30 kHz band)

Amplitude and Offset
• Output range: 50 mVpp to 10 Vpp (50 Ω); 100 mVpp to 20 Vpp (high-Z load)
• DC offset: ±5 VDC (50 Ω); ±10 VDC (high-Z load)
• Amplitude resolution: 3 digits
• Amplitude accuracy: 0.1 dB (sine)

Modulation and Sweeps
• FSK: internal (50 kHz max) and external (1 MHz TTL)
• Frequency sweeps: linear and logarithmic, phase-continuous
• Sweep rate: 0.01 Hz to 1 kHz
• Sweep span: full range (linear), 6 decades (logarithmic)
• Bidirectional sweep capability with rear-panel output

Timebase
• Standard accuracy: ±5 ppm (20–30 °C)
• Optional TCXO: 2 ppm stability and aging (20–50 °C)

– Key Features

• Non-volatile memory stores nine instrument configurations
• Optional RS-232 and GPIB interfaces with full remote control
• Compact benchtop form factor: 8.5" W × 3.5" H × 13" D, 8 lbs
• Low power consumption: 22 W
• Universal AC input: 100/120/220/240 VAC, 50/60 Hz

– Typical Applications

• Circuit characterization and validation
• Component testing and device qualification
• Frequency response measurements
• Modulation and sweep testing in development labs